Red shift and higher photoluminescence emission of CCTO thin films undergoing pressure treatment


Autoria(s): Sequinel, T.; Garcia, I. G.; Tebcherani, S. M.; Kubaski, E. T.; Oliveira, L. H.; Siu Li, M.; Longo, Elson; Varela, José Arana
Contribuinte(s)

Universidade Estadual Paulista (UNESP)

Data(s)

27/05/2014

27/05/2014

01/01/2014

Resumo

CCTO thin films were deposited on Pt(1 1 1)/Ti/SiO2/Si substrates using a chemical (polymeric precursor) and pressure method. Pressure effects on CCTO thin films were evaluated by X-ray diffraction (XRD), field emission scanning electron microscopy (FE-SEM) and optical properties which revealed that a pressure film (PF) is denser and more homogeneous than a chemical film (CF). Pressure also causes a decrease in the band gap and an increase in the photoluminescence (PL) emission of CCTO films which suggests that the pressure facilitates the displacement of Ti in the titanate clusters and the charge transference from TiO6 to [TiO5V0z], [TiO5V0z] to [CaO11V0z] and [TiO5V0z] to [CuO4]x. © 2013 Elsevier B.V. All rights reserved.

Formato

488-491

Identificador

http://dx.doi.org/10.1016/j.jallcom.2013.08.210

Journal of Alloys and Compounds, v. 583, p. 488-491.

0925-8388

http://hdl.handle.net/11449/76933

10.1016/j.jallcom.2013.08.210

WOS:000326035200083

2-s2.0-84884510764

Idioma(s)

eng

Relação

Journal of Alloys and Compounds

Direitos

closedAccess

Palavras-Chave #CCTO #Photoluminescence #Pressure method #Thin films
Tipo

info:eu-repo/semantics/article