Near-field distribution of optical transmission of periodic subwavelength holes in a metal film

Optical transmission of a two-dimensional array of subwavelength holes in a metal film has been numerically studied using a differential method. Transmission spectra have been calculated showing a significant increase of the transmission in certain spectral ranges corresponding to the excitation of the surface polariton Bloch waves on a metal surface with a periodic hole structure. Under the enhanced transmission conditions, the near-field distribution of the transmitted light reveals an intensity enhancement greater than 2 orders of magnitude in localized (similar to 40 nm) spots resulting from the interference of the surface polaritons Bragg scattered by the holes in an array.

Retrodirective Array Performance in the Presence of Near Field Obstructions

We investigate the situation where there are obstructing elements present in the near field of a retrodirective array. We describe three scattering cases, (1) by an array of straight wires, (2) by low loss medium density fibre board partially obscuring the array, and (3) by concrete blocks, totally and then partially obscuring the array. For all scenarios retrodirective action was shown to be able to provide various degrees of automatic compensation for loss in gain relative to that which would have occurred for a conventional (non-retrodirective) array in the presence of the same scattering screens. Gain improvements of up to 10 dB were observed when the retrodirective array was used. In addition we show how the induced variation of received and re-transmited amplitudes across the array, caused by the scattering screens, is the principle mechanism causing deterioration of the retrodirective arrays monostatic response.

Passive Intermodulation Generation on Printed Lines: Near-Field Probing and Observations

The phenomenological mechanisms of passive intermodulation (PIM) in printed lines have been explored by mapping intermodulation products generated by the two-tone traveling waves in microstrip lines. Near-field probing based upon a commercial PIM analyzer has been employed for identification of the PIM sources in printed lines. The results of extensive near-field probing provide the direct experimental evidences of cumulative growth of the intermodulation products in the matched uniform microstrip lines and reveal the fundamental role of the nonlinear scattering by the lumped nonlinear inclusions in the intermodulation production. The distributed nature of the PIM generation in microstrip lines has been conclusively demonstrated and comprehensively described in terms of the four-wave mixing process that proved to be fully consistent with the results of experimental observations of third-order PIM products on the matched and mismatched microstrip lines. © 2006 IEEE.

Near-field enhancement for infrared sensor applications

A detailed investigation on planar two dimensional metallodielectric dipole arrays with enhanced near-fields for sensing applications was carried out. Two approaches for enhancing the near-fields and increasing the quality factor were studied. The reactive power stored in the vicinity of the array at resonance increases rapidly with increasing periodicity. Higher quality factors are produced as a result. The excitation of the odd mode in the presence of a perturbation gives rise to a sharp resonance with near-field enhanced by at least an order of magnitude compared to unperturbed arrays. The trade-off between near-field enhancement and thermal losses was also studied, and the effect of supporting dielectric layers on thermal losses and quality factors were examined. Secondary transmissions due to the dielectric alone were found to enhance and reduce cyclically the quality factor as a function of the thickness of the dielectric material. The performance of a perturbed frequency selective surface in sensing nearby materials was investigated. Finally, unperturbed and perturbed arrays working at infrared frequencies were demonstrated experimentally. (C) 2011 Society of Photo-Optical Instrumentation Engineers (SPIE). [DOI: 10.1117/1.3604785]