976 resultados para Atomic contacts


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The tapping mode is one of the mostly employed techniques in atomic force microscopy due to its accurate imaging quality for a wide variety of surfaces. However, chaotic microcantilever motion impairs the obtention of accurate images from the sample surfaces. In order to investigate the problem the tapping mode atomic force microscope is modeled and chaotic motion is identified for a wide range of the parameter's values. Additionally, attempting to prevent the chaotic motion, two control techniques are implemented: the optimal linear feedback control and the time-delayed feedback control. The simulation results show the feasibility of the techniques for chaos control in the atomic force microscopy. © 2012 IMechE.

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Includes bibliography

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Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

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Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

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Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

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Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

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Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

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Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

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Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

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The Frequency Modulated - Atomic Force Microscope (FM-AFM) is apowerful tool to perform surface investigation with true atomic resolution. The controlsystem of the FM-AFM must keep constant both the frequency and amplitude ofoscillation of the microcantilever during the scanning process of the sample. However,tip and sample interaction forces cause modulations in the microcantilever motion.A Phase-Locked Loop (PLL) is used as a demodulator and to generate feedback signalto the FM-AFM control system. The PLL performance is vital to the FM-AFMperformace since the image information is in the modulated microcantilever motion.Nevertheless, little attention is drawn to PLL performance in the FM-AFM literature.Here, the FM-AFM control system is simulated, comparing the performancefor di erent PLL designs.