Starbog: The Garden Virtuoso and the Turing Machine

This article will discuss a recent ensemble composition entitled Starbog which was toured and broadcast in Britain in 2006 . The composition of Starbog focused on developing working methods which combined computer-based techniques (using OpenMusic) with more subconscious means of generating musical ideas. The challenge in achieving this was as much aesthetic/philosophical as it was technical and the present article is intending as a ‘sounding’ which focuses on the influence OpenMusic has had on the composer’s music, rather than documenting the nature of the often simple application of algorithms.

A multi-output two-stage locally regularized model construction method using the extreme learning machine

This paper investigates the construction of linear-in-the-parameters (LITP) models for multi-output regression problems. Most existing stepwise forward algorithms choose the regressor terms one by one, each time maximizing the model error reduction ratio. The drawback is that such procedures cannot guarantee a sparse model, especially under highly noisy learning conditions. The main objective of this paper is to improve the sparsity and generalization capability of a model for multi-output regression problems, while reducing the computational complexity. This is achieved by proposing a novel multi-output two-stage locally regularized model construction (MTLRMC) method using the extreme learning machine (ELM). In this new algorithm, the nonlinear parameters in each term, such as the width of the Gaussian function and the power of a polynomial term, are firstly determined by the ELM. An initial multi-output LITP model is then generated according to the termination criteria in the first stage. The significance of each selected regressor is checked and the insignificant ones are replaced at the second stage. The proposed method can produce an optimized compact model by using the regularized parameters. Further, to reduce the computational complexity, a proper regression context is used to allow fast implementation of the proposed method. Simulation results confirm the effectiveness of the proposed technique. © 2013 Elsevier B.V.

Android Malware Detection Using Parallel Machine Learning Classifiers

Mobile malware has continued to grow at an alarming rate despite on-going mitigation efforts. This has been much more prevalent on Android due to being an open platform that is rapidly overtaking other competing platforms in the mobile smart devices market. Recently, a new generation of Android malware families has emerged with advanced evasion capabilities which make them much more difficult to detect using conventional methods. This paper proposes and investigates a parallel machine learning based classification approach for early detection of Android malware. Using real malware samples and benign applications, a composite classification model is developed from parallel combination of heterogeneous classifiers. The empirical evaluation of the model under different combination schemes demonstrates its efficacy and potential to improve detection accuracy. More importantly, by utilizing several classifiers with diverse characteristics, their strengths can be harnessed not only for enhanced Android malware detection but also quicker white box analysis by means of the more interpretable constituent classifiers.

Prediction of integral type failures in semiconductor manufacturing through classification methods

Smart management of maintenances has become fundamental in manufacturing environments in order to decrease downtime and costs associated with failures. Predictive Maintenance (PdM) systems based on Machine Learning (ML) techniques have the possibility with low added costs of drastically decrease failures-related expenses; given the increase of availability of data and capabilities of ML tools, PdM systems are becoming really popular, especially in semiconductor manufacturing. A PdM module based on Classification methods is presented here for the prediction of integral type faults that are related to machine usage and stress of equipment parts. The module has been applied to an important class of semiconductor processes, ion-implantation, for the prediction of ion-source tungsten filament breaks. The PdM has been tested on a real production dataset. © 2013 IEEE.

A predictive maintenance system for integral type faults based on support vector machines:An application to ion implantation

In semiconductor fabrication processes, effective management of maintenance operations is fundamental to decrease costs associated with failures and downtime. Predictive Maintenance (PdM) approaches, based on statistical methods and historical data, are becoming popular for their predictive capabilities and low (potentially zero) added costs. We present here a PdM module based on Support Vector Machines for prediction of integral type faults, that is, the kind of failures that happen due to machine usage and stress of equipment parts. The proposed module may also be employed as a health factor indicator. The module has been applied to a frequent maintenance problem in semiconductor manufacturing industry, namely the breaking of the filament in the ion-source of ion-implantation tools. The PdM has been tested on a real production dataset. © 2013 IEEE.