987 resultados para Circuit arithmétique


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The increasing complexity of VLSI circuits and the reduced accessibility of modern packaging and mounting technologies restrict the usefulness of conventional in-circuit debugging tools, such as in-circuit emulators for microprocessors and microcontrollers. However, this same trend enables the development of more complex products, which in turn require more powerful debugging tools. These conflicting demands could be met if the standard scan test infrastructures now common in most complex components were able to match the debugging requirements of design verification and prototype validation. This paper analyses the main debug requirements in the design of microprocessor-based applications and the feasibility of their implementation using the mandatory, optional and additional operating modes of the standard IEEE 1149.1 test infrastructure.

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Characteristics of tunable wavelength pi'n/pin filters based on a-SiC:H multilayered stacked cells are studied both experimentally and theoretically. Results show that the device combines the demultiplexing operation with the simultaneous photodetection and self amplification of the signal. An algorithm to decode the multiplex signal is established. A capacitive active band-pass filter model is presented and supported by an electrical simulation of the state variable filter circuit. Experimental and simulated results show that the device acts as a state variable filter. It combines the properties of active high-pass and low-pass filter sections into a capacitive active band-pass filter using a changing capacitance to control the power delivered to the load.

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Dynamically reconfigurable SRAM-based field-programmable gate arrays (FPGAs) enable the implementation of reconfigurable computing systems where several applications may be run simultaneously, sharing the available resources according to their own immediate functional requirements. To exclude malfunctioning due to faulty elements, the reliability of all FPGA resources must be guaranteed. Since resource allocation takes place asynchronously, an online structural test scheme is the only way of ensuring reliable system operation. On the other hand, this test scheme should not disturb the operation of the circuit, otherwise availability would be compromised. System performance is also influenced by the efficiency of the management strategies that must be able to dynamically allocate enough resources when requested by each application. As those resources are allocated and later released, many small free resource blocks are created, which are left unused due to performance and routing restrictions. To avoid wasting logic resources, the FPGA logic space must be defragmented regularly. This paper presents a non-intrusive active replication procedure that supports the proposed test methodology and the implementation of defragmentation strategies, assuring both the availability of resources and their perfect working condition, without disturbing system operation.

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Swarm Intelligence (SI) is the property of a system whereby the collective behaviors of (unsophisticated) agents interacting locally with their environment cause coherent functional global patterns to emerge. Particle swarm optimization (PSO) is a form of SI, and a population-based search algorithm that is initialized with a population of random solutions, called particles. These particles are flying through hyperspace and have two essential reasoning capabilities: their memory of their own best position and knowledge of the swarm's best position. In a PSO scheme each particle flies through the search space with a velocity that is adjusted dynamically according with its historical behavior. Therefore, the particles have a tendency to fly towards the best search area along the search process. This work proposes a PSO based algorithm for logic circuit synthesis. The results show the statistical characteristics of this algorithm with respect to number of generations required to achieve the solutions. It is also presented a comparison with other two Evolutionary Algorithms, namely Genetic and Memetic Algorithms.

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Passive films were grown in potentiodynamic mode, by cyclic voltammetry on AISI 316 and AISI 304 stainless steels. The composition of these films was investigated by X-ray photoelectron spectroscopy (XPS). The electrochemical behaviour and the chemical composition of the passive films formed by cyclic voltammetry were compared to those of films grown under natural conditions (by immersion at open circuit potential, OCP) in alkaline solutions simulating concrete. The study included the effect of pH of the electrolyte and the effect of the presence of chloride ions. The XPS results revealed important changes in the passive film composition, which becomes enriched in chromium and depleted in magnetite as the pH decreases. On the other hand, the presence of chlorides promotes a more oxidised passive layer. The XPS results also showed relevant differences on the composition of the oxide layers for the films formed under cyclic voltammetry and/or under OCP.

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Mestrado em Engenharia Química - Ramo Optimização Energética na Indústria Química

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O uso das Field-Programmable Gate Array tem crescido de forma exponencial. Com isto dito, é importante que os engenheiros electrotécnicos estejam familiarizados com este tipo de tecnologia. Foi com o intuído de passar estas valências para os alunos do ISEP, que surgiu a ideia de criar um sistema didáctico, que permitisse ao alunos aprender a trabalhar com estes dispositivos. O seguinte trabalho iniciou-se com base num estudo das características destes dispositivos e das suas potencialidades, seguido de uma avaliação do que o mercado tem para oferecer. Posteriormente, com base em toda a informação reunida, foi definida a arquitectura do sistema, que levou selecção de dispositivos a incluir no mesmo, e culminando na concepção do esquema eléctrico do sistema e da placa de circuito impresso correspondente ao protótipo do mesmo. As principais directivas para este projecto foram o uso de uma FPGA de alta densidade e a concepção da ferramenta com o custo de projecto o mais reduzido possível.

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The operation of generalized Marx-type solid-state bipolar modulators is discussed and compared with simplified Marx-derived circuits, to evaluate their capability to deal with various load conditions. A comparative analysis on the number of switches per cell, fiber optic trigger count, losses, and switch hold-off voltages has been made. A circuit topology is obtained as a compromise in terms of operating performance, trigger simplicity, and switching losses. A five-stage laboratory prototype of this circuit has been assembled using 1200 V insulated gate bipolar transistors (IGBTs) and diodes, operating with 1000 V dc input voltage and 1 kHz frequency, giving 5 kV bipolar pulses, with 2.5 mu s pulse width and 5 mu s relaxation time into resistive, capacitive, and inductive loads.

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In Proceedings of the “ECCTD '01 - European Conference on Circuit Theory and Design, Espoo, Finland, August 2001

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IEEE International Symposium on Circuits and Systems, MAY 25-28, 2003, Bangkok, Thailand. (ISI Web of Science)

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Dissertação para obtenção do grau de Mestre em Engenharia Eletrotécnica Ramo de Automação e eletrónica Industrial

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Fractional calculus (FC) is no longer considered solely from a mathematical viewpoint, and is now applied in many emerging scientific areas, such as electricity, magnetism, mechanics, fluid dynamics, and medicine. In the field of dynamical systems, significant work has been carried out proving the importance of fractional order mathematical models. This article studies the electrical impedance of vegetables and fruits from a FC perspective. From this line of thought, several experiments are developed for measuring the impedance of botanical elements. The results are analyzed using Bode and polar diagrams, which lead to electrical circuit models revealing fractional-order behaviour.

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To boost logic density and reduce per unit power consumption SRAM-based FPGAs manufacturers adopted nanometric technologies. However, this technology is highly vulnerable to radiation-induced faults, which affect values stored in memory cells, and to manufacturing imperfections. Fault tolerant implementations, based on Triple Modular Redundancy (TMR) infrastructures, help to keep the correct operation of the circuit. However, TMR is not sufficient to guarantee the safe operation of a circuit. Other issues like module placement, the effects of multi- bit upsets (MBU) or fault accumulation, have also to be addressed. In case of a fault occurrence the correct operation of the affected module must be restored and/or the current state of the circuit coherently re-established. A solution that enables the autonomous restoration of the functional definition of the affected module, avoiding fault accumulation, re-establishing the correct circuit state in real-time, while keeping the normal operation of the circuit, is presented in this paper.

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To increase the amount of logic available in SRAM-based FPGAs manufacturers are using nanometric technologies to boost logic density and reduce prices. However, nanometric scales are highly vulnerable to radiation-induced faults that affect values stored in memory cells. Since the functional definition of FPGAs relies on memory cells, they become highly prone to this type of faults. Fault tolerant implementations, based on triple modular redundancy (TMR) infrastructures, help to keep the correct operation of the circuit. However, TMR is not sufficient to guarantee the safe operation of a circuit. Other issues like the effects of multi-bit upsets (MBU) or fault accumulation, have also to be addressed. Furthermore, in case of a fault occurrence the correct operation of the affected module must be restored and the current state of the circuit coherently re-established. A solution that enables the autonomous correct restoration of the functional definition of the affected module, avoiding fault accumulation, re-establishing the correct circuit state in realtime, while keeping the normal operation of the circuit, is presented in this paper.

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Trabalho Final de Mestrado para obtenção do grau de Mestre em Engenharia Electrotécnica Ramo de Automação e Electrónica Industrial