Millimeter-wave measurements of the complex dielectric constant of an advanced thick film UV photoresist

The first measurement of the relative permittivity (εr) and loss tangent (tan δ) of EPON™ SU-8 advanced thick film ultraviolet photoresist is reported at frequencies between 75–110 GHz (W-band). The problems associated with such a measurement are discussed, an error analysis given, and values of εr=1.725±0.08 and tanδ =0.02±0.001 are determined.

Advanced methods in adaptive control for industrial applications

This volume is based on a seminar concerned with advanced methods in adaptive control for industrial applications which was held in Prague in May 1990 and which brought together experts in the UK and Czechoslovakia in order to suggest solutions to specific current and anticipated problems faced by industry.

Analysing lexical richness in French learner language: what frequency lists and teacher judgements can tell us about basic and advanced words

We show how teacher judgements can be used to assess the quality of vocabulary used by L2 learners of French.