The study on the interface adhesion comparison of the MgF2, Al2O3, SiO2 and Ag thin films

Adhesion between the interface of pure silver thin film and three kinds of low refractive index coatings MgF2, Al2O3, SiO2 were compared in this article. The results indicated that the adhesion of Al2O3 and Ag was evidently superior to that of MgF2 and Ag, and the adhesion of MgF2 and Ag was evidently superior to that Of SiO2 and Ag. Reasons were analyzed accordingly. On the other hand, we compared the effect on the optical characteristic of Ag film when these three kinds of films were used as protective coatings and enhanced coatings. Considering the difference of the adhesion between Ag and MgF2, Al2O3, SiO2, suited uses are given for each other. © 2004 Elsevier B.V. All rights reserved.

Extended bidirectional reflectance distribution function for polarized light scattering from subsurface defects under a smooth surface

By introducing the scattering probability of a subsurface defect (SSD) and statistical distribution functions of SSD radius, refractive index, and position, we derive an extended bidirectional reflectance distribution function (BRDF) from the Jones scattering matrix. This function is applicable to the calculation for comparison with measurement of polarized light-scattering resulting from a SSD. A numerical calculation of the extended BRDF for the case of p-polarized incident light was performed by means of the Monte Carlo method. Our numerical results indicate that the extended BRDF strongly depends on the light incidence angle, the light scattering angle, and the out-of-plane azimuth angle. We observe a 180 degrees symmetry with respect to the azimuth angle. We further investigate the influence of the SSD density, the substrate refractive index, and the statistical distributions of the SSD radius and refractive index on the extended BRDF. For transparent substrates, we also find the dependence of the extended BRDF on the SSD positions. (c) 2006 Optical Society of America.

Theoretical analysis of optical properties of dielectric coatings dependence on substrate subsurface defects

A model for refractive index of stratified dielectric substrate was put forward according to theories of inhomogeneous coatings. The substrate was divided into surface layer, subsurface layer and bulk layer along the normal direction of its surface. Both the surface layer (separated into N-1 sublayers of uniform thickness) and subsurface layer (separated into N-2 sublayers of uniform thickness), whose refractive indices have different statistical distributions, are equivalent to inhomogeneous coatings, respectively. And theoretical deduction was carried Out by employing characteristic matrix method of optical coatings. An example of mathematical calculation for optical properties of dielectric coatings had been presented. The computing results indicate that substrate subsurface defects can bring about additional bulk scattering and change propagation characteristic in thin film and Substrate. Therefore, reflectance, reflective phase shift and phase difference of an assembly of coatings and substrate deviate from ideal conditions. The model will provide some beneficial theory directions for improving optical properties of dielectric coatings via substrate surface modification. (c) 2005 Elsevier B.V. All rights reserved.

Temperature fields of 355 nm HR coatings based on the interface absorption model

Temperature fields of 355 nm high-reflectance (HR) coatings were investigated based on the interface absorption model. It was found that the highest temperature in the HR coatings increased with an increase in the extinction coefficient of the interface A, B, C, Al2O3 and MgF2. The highest temperature of HR coatings that can be reached increased quickly with the increase in the extinction coefficient of interface A in particular. The temperature rises of 355 nm HR coatings at different layers and different deposition temperatures were investigated based on experiments also. The damage mechanism of 355 nm HR coatings was confirmed with temperature fields and the interface absorption model.

Além da Linha Vermelha: um estudo sobre a formação de professores em Física, Química e Matemática na interface das políticas públicas e do mundo do trabalho

Esta pesquisa realiza um estudo sobre a formação de professores em Física, Química e Matemática na dimensão das políticas públicas educacionais e das novas ordenações do mundo produtivo. O eixo metodológico investe na abordagem qualitativa, elegendo como campo empírico o Instituto de Educação, Ciência e Tecnologia do Rio de Janeiro (IFRJ), mais especificamente, o campus Nilópolis, localizado na região da Baixada Fluminense (recorte geopolítico), no Estado do Rio de Janeiro. A técnica de pesquisa baseou-se na realização de entrevistas com licenciandos cujo perfil compreende àquele que tenha realizado atividades de estágio docente. Esta escolha justifica-se por ser este o perfil de estudante mais próximo do término do curso e que, principalmente, através desta experiência, apresenta concepções, ainda que iniciais, da realidade da educação básica. Este estudo investiu na história dos sujeitos participantes através de seus respectivos relatos, onde foi possível categorizá-los em importantes aspectos que se interconectam: 1) na análise das políticas públicas para a educação superior a partir da ênfase na investigação de como estas se efetivam em uma territorialidade e no contexto de uma nova institucionalidade; 2) na reflexão sobre o impacto das transformações do mundo do trabalho na subjetividade dos licenciandos, engendrando a possível atividade docente no cenário de crise de identidades profissionais; e 3) no exame da realidade das escolas da educação básica, espaço onde a formação se destina. Este caminho permitiu refletir sobre o lugar do magistério nas escolhas de formação e nas perspectivas profissionais.