Effect of defects on the reflectivity of Cr/C multilayer soft X-ray mirror at 4.48 nm

Autoria(s): Songwen Deng; Hongji Qi; Kui Yi; Zhengxiu Fan; Jianda Shao
Data(s)

16/05/2009
Identificador

http://ir.siom.ac.cn/handle/181231/6654

http://www.irgrid.ac.cn/handle/1471x/12996
Idioma(s)

英语
Fonte

Songwen Deng,Hongji Qi, Kui Yi,Zhengxiu Fan, Jianda Shao.Effect of defects on the reflectivity of Cr/C multilayer soft X-ray mirror at 4.48 nm.Applied Surface Science,2009,255:7434-7438
Palavras-Chave #其他
Tipo

期刊论文
Acesso ao item digital