Modelling the effects of interface traps on scanning capacitance microsopy dC/dV measurement

Scanning capacitance microscopy (SCM) measurement is a proposed tool for dopant profile extraction for semiconductor material. The influence of interface traps on SCM dC/dV data is still unclear. In this paper we report on the simulation work used to study the nature of SCM dC/dV data in the presence of interface traps. A technique to correctly simulate dC/dV of SCM measurement is then presented based on our justification. We also analyze how charge of interface traps surrounding SCM probe would affect SCM dC/dV due the small SCM probe dimension.

FDTD study of an UWB radar technique for breast tumor detection

A finite difference time domain (FDTD) method is applied to investigate capabilities of an ultra-wide band (UWB) radar system to detect a breast tumor. The first part of the investigations concerns FDTD simulations of a phantom formed by a plastic container with liquid and a small reflecting target. The second part focuses on a three-dimensional numerical breast model with a small tumor. FDTD simulations are carried out assuming a planar incident wave. Various time snap shots of the electromagnetic field are recorded to learn about the physical phenomenon of reflection and scattering in different layers of the phantom.