994 resultados para Mos


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Oct. 16, 1979.

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"UILU-ENG 79 1745"--Cover.

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Thesis (M. S.)--University of Illinois at Urbana-Champaign.

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Thesis (M. S.)--University of Illinois at Urbana-Champaign.

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Thesis-University of Illinois at Urbana-Champaign.

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Vita.

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Official stenographic report of the debates of the conference.

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May 10, 1978.

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At head of title: Comisia istoricǎ a României.

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Thermal stability of AlGaN/GaN MOS-HEMTs and -diodes using Gd_(2)O_(3) are investigated by means of different thermal cycles and storage tests up to 500ºC for one week. IV DC and pulsed characteristics of the devices before and after the processes are evaluated and compared with conventional HEMTs. Results show that the devices with Gd_(2)O_(3) dielectric layer have lower leakage current and a more stable behavior during thermal treatment processes compared with conventional devices. In fact, an excellent on/off ratio of about 108 and a stable V_(t) is observed after storage at high temperature. The beneficial effects of Gd_(2)O_(3) on trapping effects of MOS-HEMTs are also dis-cussed.

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Relatório elaborado para obtenção do grau de mestre em educação pré-escolar