Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script /
| Data(s) |
01/10/1976
|
|---|---|
| Resumo |
Includes bibliographical references (p. 14). Mode of access: Internet. |
| Formato |
bib bib bib |
| Identificador |
http://hdl.handle.net/2027/uiug.30112104131450 |
| Idioma(s) |
eng |
| Publicador |
Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., |
| Relação |
Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script. |
| Direitos |
Items in this record are available as Public Domain, Google-digitized. View access and use profile at http://www.hathitrust.org/access_use#pd-google. Please see individual items for rights and use statements. |
| Palavras-Chave | #Condensateurs électriques #Semiconducteurs #Electric measurements. #Cryostats. #Capacitors #Semiconductors |
| Tipo |
text |
