A simple device for sampling of volumetric forest soil cores

Summary

J.V. Snellman Hegelin Oikeusfilosofian tulkitsijana

Suomen Filosofisen Yhdistyksen 125-vuotisjuhlakollokviossa 16.10.1998 pidetty esitelmä

Quantitative x-ray photoelectron spectroscopy study of Al/AlOx bilayers

An x-ray photoelectron spectroscopy (XPS) analysis of Nb/Al wedge bilayers, oxidized by both plasma and natural oxidation, is reported. The main goal is to show that the oxidation state¿i.e., O:(oxidize)Al ratio¿, structure and thickness of the surface oxide layer, as well as the thickness of the metallic Al leftover, as functions of the oxidation procedure, can be quantitatively evaluated from the XPS spectra. This is relevant to the detailed characterization of the insulating barriers in (magnetic) tunnel junctions