Apparatus and method for heat-run test on high-power PWM converters with low energy expenditure

Before installation, a voltage source converter is usually subjected to heat-run test to verify its thermal design and performance under load. For heat-run test, the converter needs to be operated at rated voltage and rated current for a substantial length of time. Hence, such tests consume huge amount of energy in case of high-power converters. Also, the capacities of the source and loads available in the research and development (R&D) centre or the production facility could be inadequate to conduct such tests. This paper proposes a method to conduct heat-run tests on high-power, pulse width modulated (PWM) converters with low energy consumption. The experimental set-up consists of the converter under test and another converter (of similar or higher rating), both connected in parallel on the ac side and open on the dc side. Vector-control or synchronous reference frame control is employed to control the converters such that one draws certain amount of reactive power and the other supplies the same; only the system losses are drawn from the mains. The performance of the controller is validated through simulation and experiments. Experimental results, pertaining to heat-run tests on a high-power PWM converter, are presented at power levels of 25 kVA to 150 kVA.

Time-Based All-Digital Technique for Analog Built-in Self-Test

A scheme for built-in self-test of analog signals with minimal area overhead for measuring on-chip voltages in an all-digital manner is presented. The method is well suited for a distributed architecture, where the routing of analog signals over long paths is minimized. A clock is routed serially to the sampling heads placed at the nodes of analog test voltages. This sampling head present at each test node, which consists of a pair of delay cells and a pair of flip-flops, locally converts the test voltage to a skew between a pair of subsampled signals, thus giving rise to as many subsampled signal pairs as the number of nodes. To measure a certain analog voltage, the corresponding subsampled signal pair is fed to a delay measurement unit to measure the skew between this pair. The concept is validated by designing a test chip in a UMC 130-nm CMOS process. Sub-millivolt accuracy for static signals is demonstrated for a measurement time of a few seconds, and an effective number of bits of 5.29 is demonstrated for low-bandwidth signals in the absence of sample-and-hold circuitry.

A controller design method for 3 phase 4 wire grid connected VSI with LCL filter

Closed loop control of a grid connected VSI requires line current control and dc bus voltage control. The closed loop system comprising PR current controller and grid connected VSI with LCL filter is a higher order system. Closed loop control gain expressions are therefore difficult to obtain directly for such systems. In this work a simplified approach has been adopted to find current and voltage controller gain expressions for a 3 phase 4 wire grid connected VSI with LCL filter. The closed loop system considered here utilises PR current controller in natural reference frame and PI controller for dc bus voltage control. Asymptotic frequency response plot and gain bandwidth requirements of the system have been used for current control and voltage controller design. A simplified lower order model, derived for closed loop current control, is used for the dc bus voltage controller design. The adopted design method has been verified through experiments by comparison of the time domain response.

Active steering of a tractor-semi-trailer

This paper develops a path-following steering control strategy for an articulated heavy goods vehicle. The controller steers the axles of the semi-trailer so that its rear end follows the path of the fifth wheel coupling: for all paths and all speeds. This substantially improves low-speed manoeuvrability, off-tracking, and tyre scrubbing (wear). It also increases high-speed stability, reduces 'rearward amplification', and reduces the propensity to roll over in high-speed transient manoeuvres. The design of a novel experimental heavy goods vehicle with three independent hydraulically actuated steering axles is presented. The path-following controller is tested on the experimental vehicle, at low and high speeds. The field test results are compared with vehicle simulations and found to agree well. The benefits of this steering control approach are quantified. In a low-speed 'roundabout' manoeuvre, low-speed off-tracking was reduced by 73 per cent, from 4.25 m for a conventional vehicle to 1.15 m for the experimental vehicle; swept-path width was reduced by 2 m (28 per cent); peak scrubbing tyre forces were reduced by 83 per cent; and entry tail-swing was eliminated. In an 80 km/h lane-change manoeuvre, peak path error for the experimental vehicle was 33 per cent less than for the conventional vehicle, and rearward amplification of the trailer was 35 per cent less. Increasing the bandwidth of the steering actuators improved the high-speed dynamic performance of the vehicle, but at the expense of increased oil flow.

Bias-free identification of a linear model-predictive steering controller from measured driver steering behavior

Recent developments in modeling driver steering control with preview are reviewed. While some validation with experimental data has been presented, the rigorous application of formal system identification methods has not yet been attempted. This paper describes a steering controller based on linear model-predictive control. An indirect identification method that minimizes steering angle prediction error is developed. Special attention is given to filtering the prediction error so as to avoid identification bias that arises from the closed-loop operation of the driver-vehicle system. The identification procedure is applied to data collected from 14 test drivers performing double lane change maneuvers in an instrumented vehicle. It is found that the identification procedure successfully finds parameter values for the model that give small prediction errors. The procedure is also able to distinguish between the different steering strategies adopted by the test drivers. © 2006 IEEE.

Identification of the steering control behaviour of five test subjects following a randomly curving path in a driving simulator

The paper is concerned with the identification of theoretical preview steering controllers using data obtained from five test subjects in a fixed-base driving simulator. An understanding of human steering control behaviour is relevant to the design of autonomous and semi-autonomous vehicle controls. The driving task involved steering a linear vehicle along a randomly curving path. The theoretical steering controllers identified from the data were based on optimal linear preview control. A direct-identification method was used, and the steering controllers were identified so that the predicted steering angle matched as closely as possible the measured steering angle of the test subjects. It was found that identification of the driver's time delay and noise is necessary to avoid bias in identification of the controller parameters. Most subjects' steering behaviour was predicted well by a theoretical controller based on the lateral/yaw dynamics of the vehicle. There was some evidence that an inexperienced driver's steering action was better represented by a controller based on a simpler model of the vehicle dynamics, perhaps reflecting incomplete learning by the driver. Copyright © 2014 Inderscience Enterprises Ltd.

Frequency bandwidth estimation of TO packaging techniques for laser modules

Two simple methods for estimating the potential modulation bandwidth of TO packaging technique are presented. The first method is based upon the comparison of the measured frequency responses of the laser diodes and the TO laser modules, and the second is from the equivalent circuit for the test fixture, the TO header, the submount and the bonding wire. It is shown that the TO packaging techniques used in the experiments can potentially achieve a frequency bandwidth of over 10.5 GHz, and the two proposed methods give similar results.

New algorithms of the TSM and TOM methods for calibrating microwave test fixtures

Based on the conventional through-short-match (TSM) method, an improved TSM method has been proposed in this Letter. This method gives an analytical solution and has almost all the advantages of conventional TSM methods. For example, it has no phase uncertainty and no bandwidth limitation. The experimental results show that the accuracy can be significantly improved with this method. The proposed theory can be applied to the through-open-match (TOM) method. (C) 2002 Wiley Periodicals. Inc.

Phase uncertainty in calibrating microwave test fixtures

The problem of phase uncertainty arising in calibration of the test fixtures is investigated in this paper, It is shown that the problem exists no matter what kinds of calibration standards are used. It is also found that there is no need to determine the individual S-parameters of the test fixtures. In order to eliminate the problem of phase uncertainty, three different precise (known) reflection standards or one known reflection standard plus one known transmission standard should be used to calibrate symmetrical test fixtures. For the asymmetrical cases, three known standards, including at least one transmission standard, should be used. The thru-open-match (TOM) and thru-short-match (TSM) techniques are the simplest methods, and they have no bandwidth limitation. When the standards are imprecise (unknown), it is recommended to use any suitable technique, such as the thru-reflect-line, line-reflect-line, thru-short-delay, thru-open-delay,line-reflect-match, line-reflect-reflect-match, or multiline methods, to accurately determine the values of the required calibration terms and, in addition, to use the TOM or TSM method with the same imprecise standards to resolve the phase uncertainty.

Small-signal and large-signal performance test of high-speed optoelectronics devices

This paper presents measurement methods for determining the reflection coefficients and frequency responses of semiconductor laser diodes, photodiodes, and EA modulator chips. A novel method for determining the intrinsic frequency responses of laser diodes is also proposed, and applications of the developed measurement methods are discussed. We demonstrate the compensation of bonding wire on the capacitances of both the submount and the laser diode, and present a method for estimating the potential modulation bandwidth of TO packaging technique. Initial study on removing the effects of test fixture on large-signal performances of optoelectronic devices at high data rate is also given.

automated test case generation for the stress testing of multimedia systems

With the advancement in network bandwidth and computing power, multimedia systems have become a popular means for information delivery. However, general principles of system testing cannot be directly applied to testing of multimedia systems on account of their stringent temporal and synchronization requirements. In particular, few studies have been made on the stress testing of multimedia systems with respect to their temporal requirements under resource saturation. Stress testing is important because erroneous behavior is most likely to occur under resource saturation. This paper presents an automatable method of test case generation for the stress testing of multimedia systems. It adapts constraint solving techniques to generate test cases that lead to potential resource saturation in a multimedia system. Coverage of the test cases is defined upon the reachability graph of a multimedia system. The proposed stress testing technique is supported by tools and has been successfully applied to a real-life commercial multimedia system. Although our technique focuses on the stress testing of multimedia systems, the underlying issues and concepts are applicable to other types of real-time systems.

Bandwidth Design for CMOS Monolithic Photoreceiver

A monolithic photoreceiver which consists of a double photodiode (DPD) detector and a regulated cascade(RGC) transimpedance amplifier (TIA) is designed. The small signal circuit model of DPD is given and the band width design method of a monolithic photoreceiver is presented. An important factor which limits the bandwidth of DPD detector and the photoreceiver is presented and analyzed in detail. A monolithic photoreceiver with 1.71GHz bandwidth and 49dB transimpedance gain is designed and simulated by applying a low-cost 0. 6um CMOS process and the test result is given.

Measurement of 3db Bandwidth of Laser Diode Chips

An accurate technique for measuring the frequency response of semiconductor laser diode chips is proposed and experimentally demonstrated. The effects of test jig parasites can be completely removed in the measurement by a new calibration method. In theory, the measuring range of the measurement system is only determined by the measuring range of the instruments network analyzer and photo detector. Diodes' bandwidth of 7.5GHz and 10GHz is measured. The results reveal that the method is feasible and comparing with other method, it is more precise andeasier to use.

Using test infrastructures for (remote) online evaluation of the sensitivity to SEUs of FPGAs

This paper proposes an online mechanism that can evaluate the sensitivity of single event upsets (SEUs) of field programmable gate arrays (FPGAs). The online detection mechanism cyclically reads and compares the values form the external and internal configuration memories, taking into account the mask information. This remote detection method also signals any mismatch as a result of a SEU that affects both used and not-used FPGA parts, which maximizes the monitored area. By utilizing an external, Web-accessible controller that is connected to the test infrastructure, the possibility of running the same operation in a remote manner is enabled. Moreover, the need for a local memory to store the mask values is also eliminated.

Board-level prototype validation: a built-in controller and extended BST architecture

Prototype validation is a major concern in modern electronic product design and development. Simulation, structural test, functional and timing debug are all forming parts of the validation process, although very often addressed as dissociated tasks. In this paper we describe an integrated approach to board-level prototype validation, based on a set of mandatory/optional BST instructions and a built-in controller for debug and test, that addresses the late mentioned tasks as inherent parts of a whole process