Characterization of defects and whole wafer uniformity of annealed undoped semi-insulating InP wafers

Semi-insulating (SI) InP wafers of 2 and 3 in. diameters have been prepared by annealing undoped LEC InP at 930 degreesC for 80 h under pure phosphorus ambient (PP) and iron phosphide ambient (IP). The electrical uniformity of annealed undoped SI wafers, along with a Fe-doped as-grown SI LEC InP wafer, has been characterized by whole wafer PL mapping and radial Hall measurements. Defects in these wafers have been detected by photo-induced current transient spectroscopy (PICTS). The results indicated that the uniformity of IP wafer is much better than that of PP wafer and as-grown Fe-doped Si InP wafer. There are fewer traps in undoped SI InP IP wafer than in as grown Fe-doped and undoped SI InP PP wafer, as evidenced by PICTS. The good uniformity of the IP wafer is related to the nonexistence of high concentration of thermally induced defects. The mechanism for this phenomenon is discussed based on the results. (C) 2002 Elsevier Science B.V. All rights reserved.

Fast Discrimination of Commerical Corn Varieties Based on Near Infrared Spectra

The existing methods for the discrimination of varieties of commodity corn seed are unable to process batch data and speed up identification, and very time consuming and costly. The present paper developed a new approach to the fast discrimination of varieties of commodity corn by means of near infrared spectral data. Firstly, the experiment obtained spectral data of 37 varieties of commodity corn seed with the Fourier transform near infrared spectrometer in the wavenurnber range from 4 000 to 12 000 cm (1). Secondly, the original data were pretreated using statistics method of normalization in order to eliminate noise and improve the efficiency of models. Thirdly, a new way based on sample standard deviation was used to select the characteristic spectral regions, and it can search very different wavenumbers among all wavenumbers and reduce the amount of data in part. Fourthly, principal component analysis (PCA) was used to compress spectral data into several variables, and the cumulate reliabilities of the first ten components were more than 99.98%. Finally, according to the first ten components, recognition models were established based on BPR. For every 25 samples in each variety, 15 samples were randomly selected as the training set. The remaining 10 samples of the same variety were used as the first testing set, and all the 900 samples of the other varieties were used as the second testing set. Calculation results showed that the average correctness recognition rate of the 37 varieties of corn seed was 94.3%. Testing results indicate that the discrimination method had higher precision than the discrimination of various kinds of commodity corn seed. In short, it is feasible to discriminate various varieties of commodity corn seed based on near infrared spectroscopy and BPR.

新型土壤改良剂对夏玉米生理生长特性的影响

通过大田玉米试验,验证新型土壤改良剂对夏玉米生育期土壤水分、紧实度及玉米生理生长特性的影响。结果表明,施用改良剂PJG和PFL夏玉米全生育期平均株高、叶面积分别高于对照20.7%、19.75%和51.88%、72.37%;2种改良剂对干物质积累的影响存在差异,影响效果依次为茎干重>叶干重>根干重。夏玉米光合速率和叶绿素含量受土壤改良剂影响较大,PJG和PFL分别高于对照29.96%、24.48%和73.36%、68.53%。在0~10 cm土层内,施用PJG和PFL后土壤紧实度分别低于对照44.44%和42.91%。施用改良剂PJG后,0~20 cm土层土壤含水量维持在田间持水量的77.9%左右,未施用改良剂土壤,夏玉米生育期表层土壤含水量起伏变化较大。土壤改良剂PJG在夏玉米的施用效果略好于PFL。

Characterization of defects and whole wafer uniformity of annealed undoped semi-insulating InP wafers

Semi-insulating (SI) InP wafers of 2 and 3 in. diameters have been prepared by annealing undoped LEC InP at 930 degreesC for 80 h under pure phosphorus ambient (PP) and iron phosphide ambient (IP). The electrical uniformity of annealed undoped SI wafers, along with a Fe-doped as-grown SI LEC InP wafer, has been characterized by whole wafer PL mapping and radial Hall measurements. Defects in these wafers have been detected by photo-induced current transient spectroscopy (PICTS). The results indicated that the uniformity of IP wafer is much better than that of PP wafer and as-grown Fe-doped Si InP wafer. There are fewer traps in undoped SI InP IP wafer than in as grown Fe-doped and undoped SI InP PP wafer, as evidenced by PICTS. The good uniformity of the IP wafer is related to the nonexistence of high concentration of thermally induced defects. The mechanism for this phenomenon is discussed based on the results. (C) 2002 Elsevier Science B.V. All rights reserved.

玉米冠层对喷灌水量的再分配

通过喷灌玉米田间试验,研究了喷灌水经玉米冠层再分配后的分布状况。结果表明:在玉米全生育期,茎秆下流水量占灌水量的均值为44%左右,棵间穿透水量占灌水量的均值为48%左右,冠层截留量在0.8￣2.9mm之间变化。一次灌水中,喷灌水在地表的分布很不均匀,43.2%的灌水量经茎秆下流到根区,在距离茎秆7cm,15cm,25cm和32.5cm处,地表接收的水量占总灌水量的比例分别为18.9%、43.5%、66.9%和84.5%。灌水量、种植密度、株高和叶面积指数等都影响着喷灌水在地表的分布。

Coal-burning roasted corn and chili as the cause of dental fluorosis for children in southwestern China

To find the pathologic cause of the children's dental fluorosis in southwestern China, diet structure before the age of 6 and prevalence rate of dental fluorosis (DF) of 405 children were investigated, and the fluorine and arsenic content of several materials were determined. The prevalence rate of DF of children living on roasted corn before the age of 6 is 100% with nearly 95% having the mild to severe DF; while that of children living on non-roasted corn or rice is less than 5% with all having very mild DF. The average fluorine and arsenic concentration are 20.26 mg/kg and 0.249 mg/kg in roasted corn, which are about 16 times and 35 times more than in non-roasted corn, respectively. The average fluorine concentration is 78 mg/kg in coal, 1116 mg/kg in binder clay and 313 mg/kg in briquette (coal mixed with clay). The average arsenic concentration of coal is 5.83 mg/kg, the binder clay is 20.94 mg/kg, with 8.52 mg/kg in the briquette. Living on roasted corn and chili is the main pathologic cause of endemic fluorosis in southwestern China. The main source of fluorine and arsenic pollution of roasted corn and chill is the briquette of coal and binder clay. (C) 2010 Elsevier B.V. All rights reserved.

Effect of acetylation on the properties of corn starch

Acetylated corn starches with different degrees of substitution (DS 0.85, DS 1.78, DS 2.89) were synthesized by the reaction of corn starch with acetic anhydride in the presence of acetic acid under varying reaction temperatures. The product was characterized by FTIR spectroscopy, H-1 NMR, X-ray diffraction and contact angle measurement. Acid-base titration and H-1 NMR methods were employed to determine the degree of substitution of product. FTIR spectroscopic analysis showed that the characteristic absorption intensities of esterified starch increased with increase in the degree of substitution, and the characterized peak of hydroxyl group almost disappeared in the spectrum of DS 2.89 acetylated starch. The detailed chemical microstructure of native starch and acetylated starch was confirmed by H-1 NMR, C-13 NMR and C-13-(1) H-1 COSY spectra.

Preparation and characterization of cationic corn starch with a high degree of substitution in dioxane-THF-water media

Cationic corn starch derivatives with a high degree of substitution are prepared in alkaline solution or in mixed media of organic solvent and water with different levels of the cationic reagent, 2,3-epoxypropyltrimethylammonium chloride. The starch cationization yield is investigated, and the results indicate that the degree of substitution (DS) of the samples depends on the reaction conditions and reaction media. The maximum DS values are up to 1.37 in 1,4-dioxane alkali ne-aqueous solution. Meanwhile, the structures of the cationic starch derivatives are characterized by elemental analyses, FTIR spectroscopy, X-ray diffraction, and C-13 NMR spectroscopy, as well as by SEM techniques.

Synthesis of dodecenyl succinic anhydride (DDSA) corn starch

Dodecenly succinic anhydride (DDSA) starches were prepared commercially by the base catalyzed reaction of DDSA in pre-emulsion with starch granular in aqueous slurry. The results indicated that the degree of substitution and reaction efficiency were 0.0256% and 42.7%, respectively, at the parameters for the preparation of DDSA starches in starch slurry 30%, DDSA/starch radio 10% (wt/wt), pH 8.5-9.0, reaction temperature 313 K. After modification, product surface chemical composite had been changed which was prone to migrate into less polar solution. The chemical structural characteristics were investigated by methods of FTIR and H-1 NMR. The results of X-ray diffraction showed the native A-type crystalline pattern, indicating that reaction of corn starch with DDSA caused no change in the crystalline structure. Compared to native starch, the hydrophobic performance of esters was greatly increased. With the DS increasing, contact angles were gradually increased, however, the adhesion works were decreased. The maximum contact angle of DDSA starch could attend to 123 degrees, and the corresponding adhesion work was 33.2 mJ m(-2).

Structure analysis of the fulvic acids extracted from composted corn stalk residue

Chemical structure of fulvic acids extracted from composted corn stalk residue(CSR FA)was studied by Fourier transform infrared (FTIR) spectroscopy, H-1 and C-13 nuclear magnetic resonance(H-1-NMR, C-13-NMR) spectroscopy. The results show that CSR FA mainly consists of four types of carbon: carbonyl, aromatical, alkyl and carbohydrate, the carbohydrate is dominant. Its aromaticity is 15.42%, less than that of CSR HA. This indicates that the construction of CSR FA is simpler than that of CSR HA, FA can not be extracted from undecomposed corn stalk residue. CSR FA may be formed by cellulose or hemicellulosemorties combined with aromatic compound from decomposed lignin.

Chemical constituents from the whole plant of Euphorbia altotibetic

Four new jatrophane diterpenoids, altotibetin A (1), altotibetin B (2), altotibetin C (3), altotibetin D (4), and nine known compounds, beta-sitosterol, cycloart-23-ene-3beta,25-diol, cycloart-25-ene-3beta,24-diol, lupeol acetate, scopoletin, kaempferol, uracil, uridine, astragalin, and daucosterol have been isolated from the whole plant of Euphorbia altotibetic PAULS. Their structures were established by spectral methods, and the configurations of 1 and 2 were confirmed by X-ray analysis.

Line Kinematics for Whole-Arm Manipulation

A Whole-Arm Manipulator uses every surface to both sense and interact with the environment. To facilitate the analysis and control of a Whole-Arm Manipulator, line geometry is used to describe the location and trajectory of the links. Applications of line kinematics are described and implemented on the MIT Whole-Arm Manipulator (WAM-1).