System error removal and structure optimization based on Fizeau interferometer

In the process of interferometric testing, the measurement result is influenced by the system structure, which reduces the measurement accuracy. To obtain an accurate test result, it is necessary to analyze the test system, and build the relationship between the measurement error and the system parameters. In this paper, the influences of the system elements which include the collimated lens and the standard surface on the interferometric testing are analyzed, the expressions of phase distribution and wavefront error on the detector are obtained, the method to remove some element errors is introduced, and the optimization structure relationships are given. (C) 2006 Elsevier GmbH. All rights reserved.

Effect of elliptical manufacture error of an axicon on the diffraction-free beam patterns

Based on the generalized Huygens-Fresnel diffraction integral theory and the stationary-phase method, we analyze the influence on diffraction-free beam patterns of an elliptical manufacture error in an axicon. The numerical simulation is compared with the beam patterns photographed by using a CCD camera. Theoretical simulation and experimental results indicate that the intensity of the central spot decreases with increasing elliptical manufacture defect and propagation distance. Meanwhile, the bright rings around the central spot are gradually split into four or more symmetrical bright spots. The experimental results fit the theoretical simulation very well. (C) 2008 Society of Photo-Optical Instrumentation Engineers.

Aplicación de redes neuronales artificiales para la caracterización del error en trayectorias circulares por WEDM

El objeto del presente trabajo, titulado “Aplicación de redes neuronales artificiales para la caracterización del error en trayectorias circulares por WEDM”, es el estudio y posterior optimización del error en trayectorias circulares mecanizadas mediante electroerosión por hilo. Se pretende desarrollar un modelo predictivo de dicho error a través de la implementación de una Red Neuronal Artificial (RNA), que deberá ser alimentada con resultados empíricos resultantes de una batería de ensayos. El modelo desarrollado permitirá conocer a priori los errores que se producirán al cortar formas circulares en distintos espesores y con distintos radios sin necesidad de recurrir a costosas baterías de ensayos.

Caracterización del error en el corte de desbaste de trayectorias circulares mediante WEDM.

[ES]En la actualidad el proceso de mecanizado mediante electroerosión por hilo (WEDM) posee varias problemáticas a la hora de la ejecución de los cortes para producir diferentes formas, ya sean esquinas, radios de redondeo o de acuerdo y por último la realización de círculos. Es por ello por lo que se elabora el presente trabajo cuya finalidad es llegar a caracterizar los errores cometidos en el corte de desbaste de probetas con trayectorias circulares y tecnología estándar. De esta manera se podrá cuantificar las desviaciones que se producen en las piezas en función del espesor y de sus radios. Toda la información obtenida en el trabajo permitirá una futura actuación en diversos parámetros máquina, elaborando nuevas tecnologías o bien poder mitigarlos realizando correcciones geométricas, ajustando sus tolerancias.

Modelling and simulation of the second-order Doppler error of a laser dual-frequency interferometer

Only the first- order Doppler frequency shift is considered in current laser dual- frequency interferometers; however; the second- order Doppler frequency shift should be considered when the measurement corner cube ( MCC) moves at high velocity or variable velocity because it can cause considerable error. The influence of the second- order Doppler frequency shift on interferometer error is studied in this paper, and a model of the second- order Doppler error is put forward. Moreover, the model has been simulated with both high velocity and variable velocity motion. The simulated results show that the second- order Doppler error is proportional to the velocity of the MCC when it moves with uniform motion and the measured displacement is certain. When the MCC moves with variable motion, the second- order Doppler error concerns not only velocity but also acceleration. When muzzle velocity is zero the second- order Doppler error caused by an acceleration of 0.6g can be up to 2.5 nm in 0.4 s, which is not negligible in nanometric measurement. Moreover, when the muzzle velocity is nonzero, the accelerated motion may result in a greater error and decelerated motion may result in a smaller error.