Aplicações clássicas da técnica de espalhamento de raios-x a baixo ângulo em materiais nanoestruturados

The small angle X-ray scattering (SAXS) technique has been used with very much versatility and success in the structural characterization of nanostructured materials. The present work deals with a study of the principles of the SAXS technique and of some classical models employed in the structural characterization of nanostructured materials. Particularly, the study of the models and of the associated methodologies is applied to a set of samples of silica gels, of varied typical structures, prepared in the Laboratório de Novos Materiais of the Departamento de Física of the IGCE. The work discusses in an introductory chapter the principles of the SAXS technique and the foundation of classical models often used in the structural characterization of materials. The classical models and the associated methodologies were applied to a variety of silica gel structures. The studies include: i) the scattering from a system of particles - Guinier's law; ii) the asymptotic scattering from a two-phase system - Porod's law; iii) systematic deviation from Porod's law - Surface Fractal; iv) heterogeneities in solids with random size distribution - DAB Model; and v) the scattering from mass fractal structures. The analyses were carried out from experimental SAXS data obtained in several opportunities at the Laboratório Nacional de Luz Síncrotron (LNLS)

Estudo para determinação da kVp em equipamentos de raios X convencional

The quality assurance control program (QACP) in clinical radiology is very important to acquire, image quality, patient dose reduction and cost for the institution. The verification of the real tension on the x ray tube, it is one of many parameters that may be determined on a QACP. This act on image quality as absorbed dose in patient. Once proved the importance of this fact, this study come up with the determination of tension to any X ray tube used on medical routine, on quick, safe and low cost manner. To reach the aim of this study, the methodology consisted on measuring expose rates (ER) using different thicknesses of copper (Cu) plates like filters and relating these results with Half Layer Value (HLV). Afterwards, the HLV was associated to real tension that was acquired with kilo voltage of peak (kVp) measurers used on clinical routine. So walking in this path, when performed the ER, on any X ray tube, it’s possible acquire the HLV and consequently the real kVp, considering measures obtained before, on the methodology of kVp estimative development

Controle de Qualidade em Raios X Odontológico Periapical

The purpose of this work is to provide quality control requirements and security in dental x-rays in order to obtain good quality image which allows the correct diagnosis, which reduces the dose to the patient, mainly due to the repetition of tests, and decreasing cost. The requirements apply to related activities to quality control and procedures using ionizing radiation for diagnostic imaging in dentistry by evaluating a minimum set of parameters to be tested or verified. Quality control follows the Ordinance No. 453 of the Ministry of Health of 06.01.1998, SS Resolution No. 625 of 12.14.1994 and Resolution No. 64 of the Health Surveillance Center – Department of Health of Sao Paulo and National Health Surveillance Agency – Ministry of Health of Brazil. This study was conducted in the city of Marilia, Sao Paulo, along with the Company P&R Consulting and Medical Physics, in a dental clinic of the University UNIMAR in the x-ray equipment used on that site. The physical parameters of the device were tested with the aid of ionization chambers to measure rates of radiation, electrometer to measure rates of time, kV and doses, radiographic films and positioning devices. Finally, this work demonstrates the need and importance of quality control, which one ensures the proper use of x-ray machines, maintaining efficiency and at the same time it reduces the risks to the patient, to the dentist and to the general public

Determinação da sensibilidade elementar de amostras-padrão pelo método de flurescência de raios X por reflexão total

To determinate the multielemental concentrations in biological samples using the technique of total reflection X-ray fluorescence (TRFX) is essential the use of standard samples. The aim of this study is the determination of the sensitivities of the relevant elements in standard samples (Multi Element atomic spectroscopy standard solution in HNO3 I) prepared in three solutions with different and known concentrations. Based on the sensitivities of the elements contained in the multilelementar standard sample, it can estimate the sensitivity for an element found in the biological sample and consequently it is possible to determinate the concentration, even though the standard does not contain this element. The measurement of fluorescence was performed at the Brazilian Synchrotron Light Laboratory (LNLS) in Campinas

Calibração do Modelo de TBC para cálculos de espectros de raios-X

As normas nacionais e internacionais prevêem que a manutenção dos níveis de radiação deve estar abaixo do permitido. Sendo assim, a ICRP [1] (International Commission on Radiological Protection) exige métodos de otimização para garantir que o público esteja exposto aos menores níveis de radiação possíveis. Como método de otimização, aproximações teóricas e semi-empiricas podem realizar uma determinação do espectro de raios-X, sendo fundamental para o diagnóstico de energia, estimando a dose de radiações em pacientes e formulando modelos de blindagem. Métodos adequados de radioproteção foram desenvolvidos na física médica como a medicina nuclear, a radioterapia e a radiologia diagnóstica. Um dos métodos semi-empiricos utilizados é o modelo de TBC que é capaz de reproduzir e calcular os espectros gerados pelo anodo de tungstênio. Com o modelo de TBC modificado é possível também obedecer às exigências das barreiras protetoras presentes na radiologia, levando em conta a forma de onda arbitrária e a filtração adicional na geração do espectro não presente no modelo original. Além disso, realiza-se a calibração do espectro gerado para que o modelo de TBC represente a quantidade e comportamento de radiações típicas. Dessa forma, realiza-se uma revisão do modelo de TBC implementando-o ao programa matemático Matlab e comparando-o com os resultados adquiridos pelo Código MCNP-5 no Método de Monte Carlo. Os resultados encontrados são bastante satisfatórios, tanto em termos quantitativos quanto qualitativos dos feixes. Para a calibração, desenvolve-se uma análise dos espectros gerados pelo TBC Modificado aplicado ao programa Mathcad e Matlab sob as mesmas condições. Os espectros gerados apresentam o mesmo comportamento, diferindo em até 12% nos valores encontrados para camadas semi-redutoras, coeficiente de homogeneidade e energia efetiva

Controle de qualidade em raios-x convencional

The progress in radiology is related with the development of new systems of image formation with the lesser dose in the pacient. The improve of the dose in the pacient, without compromising the quality of the image, is one of the responsibilities of a medical physicist in a sector of diagnosis for image. This research has as objective to evaluate the conditions of use of an equipment of x-rays, from tests of quality control. The results gotten in this work have been part of data of an Effective Program of Quality Control (PECQ) of the sector of diagnosis for image of the Hospital das Clínicas da Faculdade de Medicina de Botucatu - UNESP (HCFMB-UNESP)

Análise multielementar pela técnica de fluorescência de raios-X de amostras de cólon de roedores com colite e tratados com prednisolona

Pós-graduação em Biologia Geral e Aplicada - IBB

Resistência de união de cimentos resinosos em superfície de cerâmica de Y-TZP após aplicação de filme vitrocerâmico

Pós-graduação em Odontologia Restauradora - ICT

Viabilidade do Código MCNPX para o Estudo da Técnica de Fluorescência de Raios-X por Reflexão Total

The X-ray fluorescence analysis (XRF) is an important technique for the qualitative and quantitative determination of chemical components in a sample. It is based on measurement of the intensity of the emitted characteristic radiation by the elements of the sample, after being properly excited. One of the modalities of this technique is the total reflection x-ray fluorescence (TXRF). In TXRF, the angle of refraction of the incident beam tends to zero and the refracted beam is tangent to the sample-support interface. Thus, there is a minimum angle of incidence that there is no refracted beam and all the incident radiation undergoes total reflection. As it is implemented in very small samples, in a film format, self-absorption effects should not very relevant. In this study, we evaluated the feasibility of using code MCNPX (Monte Carlo N - Particle eXtended), to simulate a measure implemented by the TXRF technique. In this way, it was verified the quality of response of a system by TXRF spectroscopy using synchrotron radiation as excitation beam for a simple setup, by retrieving the characteristic energies and the concentrations of the elements in the sample. The steps of data processing, after obtaining the excitation spectra, were the same as in a real experiment and included the obtaining of the sensitivity curve for the simulated system. The agreement between the theoretical and simulated values of Ka characteristic energies for different elements was lower than 1 % .The obtained concentration of the elements of the sample had high relatively errors ( between 6 and 60 % ) due mainly to lack of knowing about some realistic physical parameters of the sample , such as density . In this way, this result does not preclude the use of MCNPX code for this type of application

Complexos heterobilantanídicos luminescentes sob excitação UV e raios X

Pós-graduação em Química - IQ

Efeitos de modificações físicas sobre as propriedades de amido de tuberosas

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

Monte Carlo Semi-Empirical Model for Si(Li) X-Ray Detector: Differences between Nominal and Fitted Parameters.

A detailed characterization of a X-ray Si(Li) detector was performed to obtain the energy dependence of efficiency in the photon energy range of 6.4 - 59.5 keV. which was measured and reproduced by Monte Carlo (MC) simulations. Significant discrepancies between MC and experimental values were found when lhe manufacturer parameters of lhe detector were used in lhe simulation. A complete Computerized Tomagraphy (CT) detector scan allowed to find the correct crystal dimensions and position inside the capsule. The computed efficiencies with the resulting detector model differed with the measured values no more than 10% in most of the energy range.

Reactive sputter magnetron reactor for preparation of thin films and simultaneous in-situ structural study by X-ray diffraction.

Reactive Sputter Magnetron (RSM) is a widely used technique to thin films growing of compounds both, in research laboratories and in industrial processes. The nature of the deposited compound will depend then on the nature of the magnetron target and the nature of the ions generated in the plasma. One important aspect of the problem is the knowledge of the evolution of the film during the process of growing itself. In this work, we present the design, construction of a chamber to be installed in the Huber goniometer in the XRD2 line of LNLS in Campinas, which allows in situ growing kinetic studies of thin films.

Crystallization and preliminary X-ray diffraction analysis of selenophosphate synthetases from Trypanosoma brucei and Leishmania major

Selenophosphate synthetase (SPS) plays an indispensable role in selenium metabolism, being responsible for catalyzing the activation of selenide with adenosine 5'-triphosphate (ATP) to generate selenophosphate, the essential selenium donor for selenocysteine synthesis. Recombinant full-length Leishmania major SPS (LmSPS2) was recalcitrant to crystallization. Therefore, a limited proteolysis technique was used and a stable N-terminal truncated construct (ΔN-LmSPS2) yielded suitable crystals. The Trypanosoma brucei SPS orthologue (TbSPS2) was crystallized by the microbatch method using paraffin oil. X-ray diffraction data were collected to resolutions of 1.9 Å for ΔN-LmSPS2 and 3.4 Å for TbSPS2.

Estudo da deposição de filmes finos de BaTi(1-X)Zr(X)O3 por meio de planejamento Box-Behnken

Ferroelectric ceramics with perovskite structure (ABO3) are widely used in solid state memories (FeRAM’s and DRAM's) as well as multilayered capacitors, especially as a thin films. When doped with zirconium ions, BaTiO3-based materials form a solid solution known as barium zirconate titanate (BaTi1-xZrxO3). Also called BZT, this material can undergo significant changes in their electrical properties for a small variation of zirconium content in the crystal lattice. The present work is the study of the effects of deposition parameters of BaTi0,75Zr0,25O3 thin films by spin-coating method on their morphology and physical properties, through an experimental design of the Box-Behnken type. The resin used in the process has been synthesized by the polymeric precursor method (Pechini) and subsequently split into three portions each of which has its viscosity adjusted to 10, 20 and 30 mPa∙s by means of a rotary viscometer. The resins were then deposited on Pt/Ti/SiO2/Si substrates by spin-coating method on 15 different combinations of viscosity, spin speed (3000, 5500 and 8000 rpm) and the number of deposited layers (5, 8 and 11 layers) and then calcined at 800 ° C for 1 h. The phase composition of the films was analyzed by X-ray diffraction (XRD) and indexed with the JCPDS 36-0019. Surface morphology and grain size were observed by atomic force microscopy (AFM) indicating uniform films and average grain size around 40 nm. Images of the cross section of the films were obtained by scanning electron microscopy field emission (SEM-FEG), indicating very uniform thicknesses ranging from 140-700 nm between samples. Capacitance measurements were performed at room temperature using an impedance analyzer. The films presented dielectric constant values of 55-305 at 100kHz and low dielectric loss. The design indicated no significant interaction effects between the deposition parameters on the thickness of the films. The response surface methodology enabled better observes the simultaneous effect of variables.