Description of a radially polarized Laguerre-Gauss beam beyond the paraxial approximation

Fifth-order corrected expressions for the fields of a radially polarized Laguerre-Gauss (R-TEMn1) laser beams are derived based on perturbative Lax series expansion. When the order of Laguerre polynomial is equal to zero, the corresponding beam reduces to the lowest-order radially polarized beam (R-TEM01). Simulation results show that the accuracy of the fifth-order correction for R-TEMn1 depends not only on the diffraction angle of the beam as R-TEM01 does, but also on the order of the beam. (c) 2007 Optical Society of America.

Exact description of a cylindrically symmetrical complex-argument Laguerre-Gauss beam

Based on the perturbative series representation of a complex-source-point spherical wave an expression for cylindrically symmetrical complex-argument Laguerre-Gauss beams of radial order n is derived. This description acquires the accuracy up to any order of diffraction angle, and its first three corrected terms are in accordance with those given by Seshadri [Opt. Lett. 27, 1872 (2002)] based on the virtual source method. Numerical results show that on the beam axis the number of orders of nonvanishing nonparaxial corrections is equal to n. Meanwhile a higher radial mode number n leads to a smaller convergent domain of radius. (C) 2008 Optical Society of America.

Accurate description of a radially polarized Gaussian beam

An accurate description of a radially polarized fundamental Gaussian beam is presented on the basis of complex-source-point spherical waves (CSPSWs). In contrast to other descriptions based on the perturbative Lax series, the expressions for the electromagnetic field components of this description have explicit and simple mathematical forms. Numerical calculations show that both paraxial and fifth-order corrected beam descriptions have large relative error when the diffraction angle is large, while the accurate description based on the CSPSW approach proposed here can give field expressions which satisfy Maxwell's equations with great accuracy.

MATRIX DESCRIPTION OF DYNAMIC HOLZ DIFFRACTION TESTED ON THE STRAINED LAYER SUPERLATTICE SI/GESI

A matrix formulation has been developed and applied to simulate large-angle convergent-beam electron diffraction (LACBED) patterns from the Si/GexSi1-x strained layer superlattice (SLS). Good quantitative agreement has been achieved between experimental and simulated patterns. By utilizing dynamical HOLZ line patterns, we demonstrate that an accuracy of better than 0.1% can be achieved in the determination of the averaged lattice constant of a SLS, and the averaged number of layers of atoms within one period of SLS can be determined up to a single monolayer.

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Communication University of China; Wuhan University; James Madison University; Institute of Policy and Management, Chinese Academy of Sciences; IEEE Wuhan Section