A Fully Bayesian Approach for Combining Multilevel Failure Information in Fault Tree Quantification and Corresponding Optimal Resource Allocation

This paper presents a fully Bayesian approach that simultaneously combines basic event and statistically independent higher event-level failure data in fault tree quantification. Such higher-level data could correspond to train, sub-system or system failure events. The full Bayesian approach also allows the highest-level data that are usually available for existing facilities to be automatically propagated to lower levels. A simple example illustrates the proposed approach. The optimal allocation of resources for collecting additional data from a choice of different level events is also presented. The optimization is achieved using a genetic algorithm.

The Optimal Confidence Region for a Random Parameter

Under a two-level hierarchical model, suppose that the distribution of the random parameter is known or can be estimated well. Data are generated via a fixed, but unobservable realization of this parameter. In this paper, we derive the smallest confidence region of the random parameter under a joint Bayesian/frequentist paradigm. On average this optimal region can be much smaller than the corresponding Bayesian highest posterior density region. The new estimation procedure is appealing when one deals with data generated under a highly parallel structure, for example, data from a trial with a large number of clinical centers involved or genome-wide gene-expession data for estimating individual gene- or center-specific parameters simultaneously. The new proposal is illustrated with a typical microarray data set and its performance is examined via a small simulation study.