Circuit board accident - organizational dimension hidden by prescribed safety

This study analyzes an accident in which two maintenance workers suffered severe burns while replacing a circuit breaker panel in a steel mill, following model of analysis and prevention of accidents (MAPA) developed with the objective of enlarging the perimeter of interventions and contributing to deconstruction of blame attribution practices. The study was based on materials produced by a health service team in an in-depth analysis of the accident. The analysis shows that decisions related to system modernization were taken without considering their implications in maintenance scheduling and creating conflicts of priorities and of interests between production and safety; and also reveals that the lack of a systemic perspective in safety management was its principal failure. To explain the accident as merely non-fulfillment of idealized formal safety rules feeds practices of blame attribution supported by alibi norms and inhibits possible prevention. In contrast, accident analyses undertaken in worker health surveillance services show potential to reveal origins of these events incubated in the history of the system ignored in practices guided by the traditional paradigm.

Defects location in power systems components through a dedicated genetic algorithm

In this work the problem of defects location in power systems is formulated through a binary linear programming (BLP) model based on alarms historical database of control and protection devices from the system control center, sets theory of minimal coverage (AI) and protection philosophy adopted by the electric utility. In this model, circuit breaker operations are compared to their expected states in a strictly mathematical manner. For solving this BLP problem, which presents a great number of decision variables, a dedicated Genetic Algorithm (GA), is proposed. Control parameters of the GA, such as crossing over and mutation rates, population size, iterations number and population diversification, are calibrated in order to obtain efficiency and robustness. Results for a test system found in literature, are presented and discussed. © 2004 IEEE.

The impact of fuse link manufacturers on arc flash energy

The traditional operational and hazard control paradigm of an electrical installation has several issues pertaining to the diversity of equipment. A large maintenance inventory is a reason for concern for any manager, but the arc flash hazard is a particularly new phenomenon and the effects of equipment diversity on this phenomenon are even newer. The class of arc hazard can be increased, simply by changing the fuse link or circuit breaker manufacturer. Management pressure to operate as well as non-standard practices and installations are also partly responsible. The aim of this study is to take a typical situation in an industrial plant and to statistically simulate, by means of a dedicated software program, the fuse arc flash interruption performance of various manufacturers. The purpose of this study is to obtain a more objective indication of the influence of different fuse link manufacturers on arc flash incident energy. © 2011 IEEE.

Arc-flash energy: The impact of fuse link manufacturers

The traditional operational and hazard control paradigm of an electrical installation has several issues pertaining to the diversity of equipment. A large maintenance inventory is a reason for concern for any manager, but the arc-flash hazard is a particularly new phenomenon, and the effects of equipment diversity on this phenomenon are even newer. The class of arc hazard can be simply increased by changing the fuse link or circuit breaker manufacturer. Management pressure to operate as well as nonstandard practices and installations are also partly responsible. The aim of this article is to take a typical situation in an industrial plant and to statistically simulate, by means of a dedicated software program, the fuse arc-flash interruption performance of various manufacturers. The purpose of this article is to obtain a more objective indication of the influence of different fuse link manufacturers on arc-flash incident energy. © 1975-2012 IEEE.

Representação de linhas de transmissão monofásicas por meio de variáveis de estado: comparação das soluções numérica e analítica

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

Bifurcation Analysis of a Van der Pol-Duffing Circuit with Parallel Resistor

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

Validation of the SenseWear armband in circuit resistance training with different loads

The use of the SenseWear (TM) armband (SWA), an objective monitor of physical activity, is a relatively new device used by researchers to measure energy expenditure. These monitors are practical, relatively inexpensive and easy-to-use. The aim of the present study was to assess the validity of SWAs for the measurement of energy expenditure (EE) in circuit resistance training (CRT) at three different intensities in moderately active, healthy subjects. The study subjects (17 females, 12 males) undertook CRT at 30, 50 and 70% of the 15 repetition maximum for each exercise component wearing an SWA as well as an Oxycon Mobile (OM) portable metabolic system (a gold standard method for measuring EE). The EE rose as exercise intensity increased, but was underestimated by the SWAs. For women, Bland-Altman plots showed a bias of 1.13 +/- A 1.48 METs and 32.1 +/- A 34.0 kcal in favour of the OM system, while for men values of 2.33 +/- A 1.82 METs and 75.8 +/- A 50.8 kcal were recorded.

A multisampling time-domain CMOS imager with synchronous readout circuit

Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

Winner-take-all circuit using CMOS technology

In this paper is presented an implementation of winner-take-all circuit using CMOS technology. In the proposed configuration the inputs are current and the outputs voltage. The simulation results show that the circuit can be a winner if its input is larger than the other by 2 mu A. The simulation also shows that the response time is 100ns at a 0.2pF load capacitance. To demonstrate the functionality of the proposed circuit, a two-input winner take all circuit was built and tested by using discrete CMOS transistor array (CD40071).

Arrays of gold microelectrodes made from split integrated circuit chips

A simple and inexpensive way to fabricate arrays of gold microelectrodes is proposed. Integrated circuit chips are sawed through their middle, normal to the longest axis, leading to destruction of the silicon circuit and rupture of the gold wires that interconnect it with the external terminals. Polishing the resulting rough surface converts the tips of the wires embedded in the chip halves into arrays of gold microdisks of about 25 mu m diameter. The number of active microelectrodes (MEs), of an array depends on the number of pins in the chip, n, being typically (n/2)-4. These MEs can be used individually or externally interconnected in any combination. X-ray images of the chips and micrographs of the resulting surface of the polished arrays have revealed variable distances between neighbor MEs, which are, however, larger than 10 times the radius of the disks. This feature of the MEs prevents diffusional cross-talk between electrodes. The use of these microdisk electrodes for analytical purposes exhibits sigmoidal voltammograms, and chronoamperometric experiments confirm the nonlinear i vs. t(1/2) plots, typical for processes where radial diffusion prevails. Satisfactory uniformity was observed for the response of each electrode of an array, indicating similarity of geometry and disk areas. The potentialities of these MEs were demonstrated by the determination of cadmium at ppb levels using square wave voltammetry with preconcentration. Due to the relative ease with which these MEs can be manufactured and their good performance in (chemical) analysis, wide applications in electrochemistry and electroanalysis is envisioned.

Electrochemical studies with copper-based alloys: open-circuit potential oscillations in alkaline media

Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

Flow-through cell based on an array of gold microelectrodes obtained from modified integrated circuit chips

The construction of a flow-through cell incorporating an array of gold microelectrodes is described and its application to flow injection analysis with amperometric detection is presented, Simple modification of almost any conventional integrated circuit chip, used as an inexpensive source of pre-assembled gold micro-wires, leads to the rapid and successful preparation of arrays of 8-48 elements, the polymeric encapsulation material from the top face of the chip is removed by abrasion until the gold micro-mires (used to interconnect the silicon circuit to the external contact pins of the chip) are disrupted and their transversal (elliptical) sections become exposed. Once polished, the flat and smooth top surface of the gold microelectrode-array chip (MEAC) is provided with a spacer and fitted under pressure against an acrylic block with the reference and auxiliary electrodes, to form the electrochemical (thin-layer) flow cell, while the contact pins are plugged into a standard IC socket, This design ensures autonomous electric contact with each electrode and allows fast dismantling for polishing or substitution, the performance of flow cells with MEACs was investigated utilizing the technique of reverse pulse amperometry without oxygen removal, A method was established for the determination of the copper concentration in sugar cane spirit, regulated by law for beverages, Samples from industrial producers and small-scale (alembic) brewers were compared, With a 24 MEAC, a detection limit of 30 mu g I-l of copper (4.7 x 10(-7) mol l(-1) of Cu-II for 100 mu l injections) was calculated, Routine operation was established at a frequency of 60-90 determinations per hour, Intercomparison with atomic absorption spectrometric determinations resulted in excellent agreement.

A configurable approach to circuit simulation

This paper presents a configurable architecture which was designed to aid in the simulation of ULSI circuits at the transistor level. Elsewhere [1] this architecture was shown to be able to run such simulations several times as fast as standard circuit simulators such as SPICES. In this paper, after describing the overall idea and the the architecture of the system as a whole, I concentrate on the description of the architecture of the processing elements of the computing array.

Unbalanced Three-Phase Induction Motors Starting and Arc Welding Machines Short-Circuit Modeling

Three-Phase Induction Motors (TIM) and Arc Welding Machines (AWM) are loads of special behavior widely used in industrial and commercial installations, and therefore may contribute significantly to the deterioration of the quality of energy supplied by utilities. This paper proposes a modeling in constant power of the unbalanced TIM starting using Genetic Algorithm (GA) and AWM short-circuit based on their statics characteristics curves. The proposed models are compared with the conventional models in the literature. The results showed the good performance of the proposed models, allowing a more precise analysis of the real requests of these loads.

Determination and statistical treatment of short-circuit currents for faults on the lines of networks of 440 kV CESP system

The distribution of short-circuit current is investigated by means of two methods, one direct and the other analytic; both methods consider uniform probability distribution of line faults. In the direct method, the procedure consists of calculating fault currents at equidistant points along the line, starting from one of the end points and considering the other end open. The magnitude of the current is classified according to Brazilian standards (regulation NBR-7118). The analytic method assumes that the distribution of short-circuit currents through the busbar and the distribution of the line length connected to it are known, as well as the independence of values. The method is designed to determine the probability that fault currents through a line will surpass the pre-established magnitude, thus generating frequency distribution curves of short-circuit currents along the lines.