Influence of the degradation on the stress cracking values of high density polyethylene (HDPE) geomembranes after different exposures

This paper presents results from stress cracking (SC) tests performed in both fresh and exposed high density polyethylene (HDPE) geomembranes (GM). The HDPE GMs were exposed to ultraviolet radiation, thermal aging (air oven) and tested for chemical compatibility with sodium hydroxide. Stress cracking tests in both fresh and degraded samples were performed in accordance to ASTM D5397: Notched Constant Tensile Load Test (NCTL) and Single Point-Notched Constant Tensile Load Test (SP-NCTL). The results of the NCTL showed that the geomembrane degradation process can be considered to be a catalyst for the phenomenon of SC because it caused a 50% to 60% reduction in stress crack resistance. The most resistance reduction was observed for the sample under chemical compatibility with sodium hydroxide. For the SP-NCTL, the results showed that the samples maintain the same trend verified in the NCTL. The largest resistance reduction was evidenced in samples undergoing ultraviolet degradation. © 2012 ejge.

Evaluation of stress cracking on geomembranes after accelerated tests

This paper presents results of stress cracking tests performed in high density polyethylene (HDPE) geomembranes (GM). Stress cracking tests were performed in accordance to ASTM D5397: Notched Constant Tensile Load Test (NCTL) and Single Point-Notched Constant Tensile Load Test (SP-NCTL). Tests were conducted to the fresh sample at 50ºC (standard test) and at 70ºC (accelerated condition) in order to compare the SC values. Results from accelerated tests (NCTL) showed, for instance, a total economy of 390 hours (comparing load stages of 25% yield stress) to perform the tests.

Comparative degradation of ZnO- and SnO(2)-based polycrystalline non-ohmic devices by current pulse stress

The degradation behaviour of SnO(2)-based varistors (SCNCr) due to current pulses (8/20 mu s) is reported here for the first time in comparison with the ZnO-based commercial varistors (ZnO). Puncturing and/or cracking failures were observed in ZnO-based varistors possessing inferior thermo-mechanical properties in comparison with that found in a SCNCr system free of failures. Both systems presented electric degradation related to the increase in the leakage current and decrease in the electric breakdown field, non-linear coefficient and average value of the potential barrier height. However, it was found that a more severe degradation occurred in the ZnO-based varistors concerning their non-ohmic behaviour, while in the SCNCr system, a strong non-ohmic behaviour remained after the degradation. These results indicate that the degradation in the metal oxide varistors is controlled by a defect diffusion process whose rate depends on the mobility, the concentration of meta-stable defects and the amount of electrically active interfaces. The improved behaviour of the SCNCr system is then inferred to be associated with the higher amount of electrically active interfaces (85%) and to a higher energy necessary to activate the diffusion of the specific defects.