Novas configurações de interferômetros de quadratura e de técnicas de detecção de fase óptica baseadas em phase unwrapping

Pós-graduação em Engenharia Elétrica - FEIS

Multi-wavelength holographic profilometry - art. no. 60272L

A novel method for surface profilometry by holography is presented. We used a diode laser emitting at many wavelengths simultaneously as the light source and a Bi12TiO20 (BTO) crystal as the holographic medium in single exposure processes. The employ of multi-wavelength, large free spectral range (FSR) lasers leads to holographic images covered of interference fringes corresponding to the contour lines of the studied surface. In order to obtain the relief of the studied surface, the fringe analysis was performed by the phase stepping technique (PST) and the phase unwrapping was carried out by the Cellular-automata method. We analysed the relief of a tilted flat metallic bar and a tooth prosthesis.

Refractive and geometric lens characterization through multi-wavelength digital speckle pattern interferometry

Physical parameters of different types of lenses were measured through digital speckle pattern interferometry (DSPI) using a multimode diode laser as light source. When such lasers emit two or more longitudinal modes simultaneously the speckle image of an object appears covered of contour fringes. By performing the quantitative fringe evaluation the radii of curvature as well as the refractive indexes of the lenses were determined. The fringe quantitative evaluation was carried out through the four- and the eight-stepping techniques and the branch-cut method was employed for phase unwrapping. With all these parameters the focal length was calculated. This whole-field multi-wavelength method does enable the characterization of spherical and aspherical lenses and of positive and negative ones as well. (C) 2007 Elsevier B.V. All rights reserved.

Measurement of low-derivative surface lenses by two-laser holography with Bi12TiO20 crystals

Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

Profilometry of semiconductor components by two-colour holography with Bi12TiO20 crystals

We studied the shape measurement of semiconductor components by holography with photorefractive Bi12TiO20 crystal as holographic medium and two diode lasers emitting in the red region as light sources. By properly tuning and aligning the lasers a synthetic wavelength was generated and the resulting holographic image of the studied object appears modulated by cos2-contour fringes which correspond to the intersection of the object surface with planes of constant elevation. The position of such planes as a function of the illuminating beam angle and the tuning of the lasers was studied, as well as the fringe visibility. The fringe evaluation was performed by the four stepping technique for phase mapping and through the branch-cut method for phase unwrapping. A damage in an integrated circuit was analysed as well as the relief of a coin was measured, and a precision up to 10 μm was estimated. © 2009 SPIE.

Progressive power lens measurement by low coherence speckle interferometry

This work proposes a method for dioptric power mapping of progressive lenses through dual wavelength, low-coherence digital speckle pattern interferometry. Lens characterization finds several applications and is extremely useful in the fields of ophthalmology and astronomy, among others. The optical setup employs two red diode lasers which are conveniently aligned and tuned in order to generate a synthetic wavelength. The resulting speckle image formed onto a diffusive glass plate positioned behind the test lens appears covered of contour interference fringes describing the deformation on the light wavefront due to the analyzed lens. By employing phase stepping and phase unwrapping methods the wavefront phase was retrieved and then expressed in terms of a Zernike series. From this series, expressions for the dioptric power and astigmatic power were derived as a function of the x- and y-coordinates of the lens aperture. One spherical and two progressive lenses were measured. The experimental results presented a good agreement with those obtained through a commercial lensometer, showing the potentialities of the method. © 2013 Elsevier Ltd.

Lensometry by two-laser holography with photorefractive Bi12TiO20

Refractive and profilometric measurements of lenses were performed through holography with a photorefractive Bi12TiO20 crystal as the recording medium. Two properly aligned diode lasers emitting in the red region were employed as light sources. Both lasers were tuned in order to provide millimetric and sub-millimetric synthetic wavelengths. The surfaces of the test lens were covered by a 25-μm opaque plastic tape in order to allow the lens profilometry upon illuminating them with a collimated beam. The resulting holographic images appear covered by interference fringes corresponding to the wavefront geometry of the wave scattered by the lens. For refractive index measurement a diffusely scattering flat surface was positioned behind the uncovered lens which was also illuminated by a plane wave. The resulting contour interferogram describes the form of the wavefront after the beam traveled back and forth through the lens. The fringe quantitative evaluation was carried out through the four-stepping technique and the resulting phase map and the Branch-cut method was employed for phase unwrapping. The only non-optical procedure for lens characterization was the thickness measurement, made by a dial caliper. Exact ray tracing calculation was performed in order to establish a relation between the output wavefront geometry and the lens parameters like radii of curvature, thickness and refractive index. By quantitatively comparing the theoretical wavefront geometry with the experimental results relative uncertainties bellow 3% for refractive index and 1 % for focal length were obtained. © 2008 American Institute of Physics.