Multi-wavelength holographic profilometry - art. no. 60272L
Contribuinte(s) |
Universidade Estadual Paulista (UNESP) |
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Data(s) |
20/05/2014
20/05/2014
01/01/2006
|
Resumo |
A novel method for surface profilometry by holography is presented. We used a diode laser emitting at many wavelengths simultaneously as the light source and a Bi12TiO20 (BTO) crystal as the holographic medium in single exposure processes. The employ of multi-wavelength, large free spectral range (FSR) lasers leads to holographic images covered of interference fringes corresponding to the contour lines of the studied surface. In order to obtain the relief of the studied surface, the fringe analysis was performed by the phase stepping technique (PST) and the phase unwrapping was carried out by the Cellular-automata method. We analysed the relief of a tilted flat metallic bar and a tooth prosthesis. |
Formato |
L272-L272 |
Identificador |
http://dx.doi.org/10.1117/12.668293 Ico20: Optical Information Processing, Pts 1 and 2. Bellingham: Spie-int Soc Optical Engineering, v. 6027, p. L272-L272, 2006. 0277-786X http://hdl.handle.net/11449/39664 10.1117/12.668293 WOS:000235303400092 |
Idioma(s) |
eng |
Publicador |
Spie - Int Soc Optical Engineering |
Relação |
Ico20: Optical Information Processing, Pts 1 and 2 |
Direitos |
closedAccess |
Tipo |
info:eu-repo/semantics/conferencePaper |