Filmes de SiOx crescidos em substrato de zircônia tetragonal policristalina estabilizada por ítria: influência na durabilidade da adesão a cimentos resinosos

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

Anaerobic-aerobic treatment of swine wastewater in uasb and batch reactors in series

Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

O risco ambiental representado por campos eletromagnéticos em Presidente Prudente (SP)

Currently the mobile services represent an essential tool in daily life of the population. However, while offering greater convenience to its users, there is growing concern about the harmful effects to human health, derived from daily exposure of the public to electromagnetic fields from radio base stations (RBS), since even today, there is no study proving that longterm exposure to low-level fields are not harmful to health. In Presidente Prudente has not been a study reporting values of measurements of electromagnetic fields from base stations installed in the city. Based on these data, this study aimed to assess the levels of electromagnetic exposure in the city of Presidente Prudente regarding recommended by international bodies, as well as propose measures that can reduce public exposure to electromagnetic fields. For measuring values of electromagnetic fields, we used appliance Electromagnetic Field Meter Portable Digital - DRE-050, the Instrutherm, following the methodology suggested and adapted from the Adilza Condessa Dode’study. In total, 49 points were mapped corresponding to the areas at risk of exposure to electromagnetic fields generated by the substations of power grid, transmission towers and telecommunication towers located in the city of Presidente Prudente (SP)

Tratamento anaeróbio-aeróbio de águas residuárias do processamento de cafeeiro em reatores biológicos

Pós-graduação em Microbiologia Agropecuária - FCAV

Electrical and Mechanical Properties of Post-annealed SiC(x)N(y) Films

Amorphous SiC(x)N(y) films have been deposited on (100) Si substrates by RF magnetron sputtering of a SiC target in a variable nitrogen-argon atmosphere. The as-deposited films were submitted to thermal anneling in a furnace under argon atmosphere at 1000 degrees C for 1 hour. Composition and structure of unannealed and annealed samples were investigated by RBS and FTIR. To study the electrical characteristics of SiC(x)N(y) films, Metal-insulator-semiconductor (MIS) structures were fabricated. Elastic modulus and hardness of the films were determined by nanoindentation. The results of these studies showed that nitrogen content and thermal annealing affect the electrical, mechanical and structural properties of SiC(x)N(y) films.

Análise da produtividade agrícola da cana-de-açúcar nos estados de Mato Grosso do Sul e Goiás

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)