Very Intense Distinct Blue and Red Photoluminescence Emission in MgTiO3 Thin Films Prepared by the Polymeric Precursor Method: An Experimental and Theoretical Approach

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

Structural Effects of Nanotubes, Nanowires, and Nanoporous Ti/TiO2 Electrodes on Photoelectrocatalytic Oxidation of 4,4-Oxydianiline

The present work illustrates the effect of electrolyte composition on the self-organized TiO2 nanotube arrays electrode preparation. The influence of structural and surface morphology of the TiO2 nanotube-like anode on their photoactivity and photoelectrocatalytic performance was also investigated. TiO2 nanotubular array electrodes are grown by anodization of Ti foil in 0.25wt % NH4F/glycerol/water, but nanowires can be obtained in 4% HF-DMSO as supporting electrolyte, even when both are subjected to electrochemical anodization at 30V during 50 h. The morphological characteristics are analyzed by X-ray diffraction (XRD) and field emission scanning electron microscope (FEG-SEM). The electrodes were successfully applied in photoelectrocatalytic oxidation of 4,4'-oxydianiline (ODAN) in aqueous solution, as a model of a harmful pollutant. Complete removal of the aromatic amine was obtained after 3 hours of photoelectrocatalytic treatment on nanotubular arrays electrodes.

Influência do uso do forno de microondas ou convencional na síntese de ZrO2

Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

Microstructural and transport properties of LaNiO3-delta films grown on Si(111) by chemical solution deposition

Electrically conductive LaNiO3-delta (LNO) thin films with typical thickness of 200 nm were deposited on Si (111) substrates by a chemical solution deposition method and heat-treated in air at 700 degreesC. Structural, morphological, and electrical properties of the LNO thin films were characterized by X-ray diffraction (XRD), atomic force microscopy (AFM), field-emission scanning electron microscopy (FEG-SEM), and electrical resistivity rho(T). The thin films have a very flat surface and no droplet was found on their surfaces. The average grain size observed by AFM and FEG-SEM was approximately 100 nm in excellent agreement with XRD data. The rho(T) data showed that these thin films display a good metallic character in a large range of temperature. These results suggest the use of this conductive layer as electrode in the integration of microelectronic devices. (C) 2003 Elsevier B.V. All rights reserved.

Effect of Different Solvent Ratios (Water/Ethylene Glycol) on the Growth Process of CaMoO4 Crystals and Their Optical Properties

Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

Synthesis, growth process and photoluminescence properties of SrWO4 powders

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

Study of the annealing temperature effect on the structural and luminescent properties of SrWO4:Eu phosphors prepared by a non-hydrolytic sol-gel process

Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

Reflux synthesis and hydrothermal processing of ZrO2 nanopowders at low temperature

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

Microstructure, dielectric properties and optical band gap control on the photoluminescence behavior of Ba[Zr0.25Ti0.75]O-3 thin films

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

A new processing method of CaZn2(OH)(6)center dot 2H(2)O powders: Photoluminescence and growth mechanism

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

Structural and electrical properties of SrBi2(Ta0.5Nb0.5)(2)O-9 thin films

SrBi2(Ta0.5Nb0.5)(2)O-9 (SBTN) thin films were obtained by polymeric precursor method on Pt/Ti/SiO2/Si(1 0 0) substrates. The film is dense and crack-free after annealing at 700 degrees C for 2 h in static air. Crystallinity and morphological characteristic were examined by X-ray diffraction (XRD), field emission scanning electron microscopy (FEG-SEM) and atomic force microscopy (AFM). The films displayed rounded grains with a superficial roughness of 3.5 nm. The dielectric permittivity was 122 with loss tangent of 0.040. The remanent polarization (P-r) and coercive field (E-c) were 5.1 mu C/cm(2) and 96 kV/cm, respectively. (C) 2007 Published by Elsevier B.V.

Metal-Organic Semiconductor Nanostructures for Surface-Enhanced Raman Scattering

Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

(Sr,Tm)ZrO3 powders prepared by the polymeric precursor method: Synthesis, optical properties and morphological characteristics

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

Synthesis, Characterization, Anisotropic Growth and Photoluminescence of BaWO4

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

Preparation and characterization of ceria nanospheres by microwave-hydrothermal method

Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)