New approach to controllable nitrogen doping for improved nano-semiconductors

The data covers the following:
X-ray photoelectron spectroscopy (XPS) - to collect surface chemical structure changes (using RMIT instrument);
Scanning electron microscopy (SEM) - to collect surface physical structure changes;
Atomic force microscopy (AFM) - to collect surface morphology changes;
Internal/External quantum efficiency (IQE/EQE) – to collect DSSC (Dye Sensitised Solar Cells) efficiency data;
Discharge/Charge capacity - to collect battery efficiency data.

Doped nanostructured semiconductors produced by cold plasma combined with heat

The potential of combining cold plasma and thermal treatment for the nanofabrication of advances semiconductors was investigated.