Atomic scale analysis of light alloys using atom probe tomography

The present paper reviews recent progress in atomic-scale characterisation of composition and nanostructure of light alloy materials using the technique of atom probe tomography. In particular, the present review will highlight atom-by-atom analysis of solid solution architecture, including solute clustering and short-range order, with reference to current limitations of spatial resolution and detector efficiency of atom probe tomography and methods to address these limitations. This leads to discussion of prediction of mechanical properties by simulation and modelling of the strengthening effect exerted by solute clusters and the role of experimental atom probe data to assist in this process. The unique contribution of atom probe tomography to the study of corrosion and hydrogen embrittlement of light alloys will also be discussed as well as a brief insight into its potential application for the investigation of solute strengthening of twinning in Mg alloys.

Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene

Two-dimensional (2D) materials usually have a layer-dependent work function, which require fast and accurate detection for the evaluation of their device performance. A detection technique with high throughput and high spatial resolution has not yet been explored. Using a scanning electron microscope, we have developed and implemented a quantitative analytical technique which allows effective extraction of the work function of graphene. This technique uses the secondary electron contrast and has nanometre-resolved layer information. The measurement of few-layer graphene flakes shows the variation of work function between graphene layers with a precision of less than 10 meV. It is expected that this technique will prove extremely useful for researchers in a broad range of fields due to its revolutionary throughput and accuracy.