Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene
Data(s) |
01/01/2016
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Resumo |
Two-dimensional (2D) materials usually have a layer-dependent work function, which require fast and accurate detection for the evaluation of their device performance. A detection technique with high throughput and high spatial resolution has not yet been explored. Using a scanning electron microscope, we have developed and implemented a quantitative analytical technique which allows effective extraction of the work function of graphene. This technique uses the secondary electron contrast and has nanometre-resolved layer information. The measurement of few-layer graphene flakes shows the variation of work function between graphene layers with a precision of less than 10 meV. It is expected that this technique will prove extremely useful for researchers in a broad range of fields due to its revolutionary throughput and accuracy. |
Identificador | |
Idioma(s) |
eng |
Publicador |
Nature Publishing Group |
Relação |
http://dro.deakin.edu.au/eserv/DU:30083095/chen-quantitativesecondary-2016.pdf http://www.dx.doi.org/10.1038/srep21045 |
Direitos |
2016, The Authors |
Palavras-Chave | #Science & Technology #Multidisciplinary Sciences #Science & Technology - Other Topics #MICROSCOPY |
Tipo |
Journal Article |