Reuseable Silicon IP Cores for Discrete Wavelet Transform Applications

Architectures and methods for the rapid design of silicon cores for implementing discrete wavelet transforms over a wide range of specifications are described. These architectures are efficient, modular, scalable, and cover orthonormal and biorthogonal wavelet transform families. They offer efficient hardware utilization by exploiting a number of core wavelet filter properties and allow the creation of silicon designs that are highly parameterized, including in terms of wavelet type and wordlengths. Control circuitry is embedded within these systems allowing them to be cascaded for any desired level of decomposition without any interface glue logic. The time to produce chip designs for a specific wavelet application is typically less than a day and these are comparable in area and performance to handcrafted designs. They are also portable across a wide range of silicon foundries and suitable for field programmable gate array and programmable logic data implementation. The approach described has also been extended to wavelet packet transforms.

Comparison of Image Transform-Based Features for Visual Speech Recognition in Clean and Corrupted Videos

We present results of a study into the performance of a variety of different image transform-based feature types for speaker-independent visual speech recognition of isolated digits. This includes the first reported use of features extracted using a discrete curvelet transform. The study will show a comparison of some methods for selecting features of each feature type and show the relative benefits of both static and dynamic visual features. The performance of the features will be tested on both clean video data and also video data corrupted in a variety of ways to assess each feature type's robustness to potential real-world conditions. One of the test conditions involves a novel form of video corruption we call jitter which simulates camera and/or head movement during recording.

Forensic analysis of architectural finishes using Fourier transform infrared and Raman spectroscopy, Part I: The resin bases

The ability of Raman spectroscopy and Fourier transform infrared (FT-IR) microscopy to discriminate between resins used for the manufacture of architectural finishes was examined in a study of 39 samples taken from a commercial resin library. Both Raman and FT-IR were able to discriminate between different types of resin and both split the samples into several groups (six for FT-IR, six for Raman), each of which gave similar, but not identical, spectra. In addition, three resins gave unique Raman spectra (four in FTIR). However, approximately half the library comprised samples that were sufficiently similar that they fell into a single large group, whether classified using FT-IR or Raman, although the remaining samples fell into much smaller groups. Further sub-division of the FT-IR groups was not possible because the experimental uncertainty was of similar magnitude to the within-group variation. In contrast, Raman spectroscopy was able to further discriminate between resins that fell within the same groups because the differences in the relative band intensities of the resins, although small, were larger than the experimental uncertainty.