18 resultados para static random access memory


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The worsening of process variations and the consequent increased spreads in circuit performance and consumed power hinder the satisfaction of the targeted budgets and lead to yield loss. Corner based design and adoption of design guardbands might limit the yield loss. However, in many cases such methods may not be able to capture the real effects which might be way better than the predicted ones leading to increasingly pessimistic designs. The situation is even more severe in memories which consist of substantially different individual building blocks, further complicating the accurate analysis of the impact of variations at the architecture level leaving many potential issues uncovered and opportunities unexploited. In this paper, we develop a framework for capturing non-trivial statistical interactions among all the components of a memory/cache. The developed tool is able to find the optimum memory/cache configuration under various constraints allowing the designers to make the right choices early in the design cycle and consequently improve performance, energy, and especially yield. Our, results indicate that the consideration of the architectural interactions between the memory components allow to relax the pessimistic access times that are predicted by existing techniques.

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The area and power consumption of low-density parity check (LDPC) decoders are typically dominated by embedded memories. To alleviate such high memory costs, this paper exploits the fact that all internal memories of a LDPC decoder are frequently updated with new data. These unique memory access statistics are taken advantage of by replacing all static standard-cell based memories (SCMs) of a prior-art LDPC decoder implementation by dynamic SCMs (D-SCMs), which are designed to retain data just long enough to guarantee reliable operation. The use of D-SCMs leads to a 44% reduction in silicon area of the LDPC decoder compared to the use of static SCMs. The low-power LDPC decoder architecture with refresh-free D-SCMs was implemented in a 90nm CMOS process, and silicon measurements show full functionality and an information bit throughput of up to 600 Mbps (as required by the IEEE 802.11n standard).

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Experience continuously imprints on the brain at all stages of life. The traces it leaves behind can produce perceptual learning [1], which drives adaptive behavior to previously encountered stimuli. Recently, it has been shown that even random noise, a type of sound devoid of acoustic structure, can trigger fast and robust perceptual learning after repeated exposure [2]. Here, by combining psychophysics, electroencephalography (EEG), and modeling, we show that the perceptual learning of noise is associated with evoked potentials, without any salient physical discontinuity or obvious acoustic landmark in the sound. Rather, the potentials appeared whenever a memory trace was observed behaviorally. Such memory-evoked potentials were characterized by early latencies and auditory topographies, consistent with a sensory origin. Furthermore, they were generated even on conditions of diverted attention. The EEG waveforms could be modeled as standard evoked responses to auditory events (N1-P2) [3], triggered by idiosyncratic perceptual features acquired through learning. Thus, we argue that the learning of noise is accompanied by the rapid formation of sharp neural selectivity to arbitrary and complex acoustic patterns, within sensory regions. Such a mechanism bridges the gap between the short-term and longer-term plasticity observed in the learning of noise [2, 4-6]. It could also be key to the processing of natural sounds within auditory cortices [7], suggesting that the neural code for sound source identification will be shaped by experience as well as by acoustics.