Determination of integral fringe order in photoelasticity

The paper describes a method to determine the integral fringe order associated with a fractional fringe value that is measured using Tardy or other similar compensators. The method makes use of two different wavelengths of light to determine the fractional fringe values. Further, it does not assume the independence of the material fringe constant on the wavelength of light used. From these measured fractional fringe values, the associated integral fringe order is determined. A method to construct a ready-reckoner table is also described which helps to identify the integral fringe order from any two measured fractional fringe values.

Novel approach to estimate fringe order in Moire profilometry

A novel approach to estimate fringe order in Moire topography is proposed. Along with the light source used to create shadow of the grating on the object (as in conventional moire), proposed method uses a second light source which illuminates the object with color bands from the side. Width of each colored band is set to match that height which leads to a 2 pi phase shift in moire fringes. This facilitates one to rule the object with colored bands, which can be used to estimate fringe order using a color camera with relatively low spatial resolution with out any compromise in height sensitivity. Current proposal facilitates one to extract 3D profile of objects with surface discontinuities. It also deals with the possible usage of moire topography (when combined with the proposed method) in extracting 3D surface profile of many objects with height discontinuities using a single 2D image. Present article deals with theory and simulations of this novel side illumination based approach.

Holographic optical element based single-mode hybrid fiber optic interferometer for realizing zero-order fringe

A holographic optical element (HOE) based single-mode hybrid fiber optic interferometer for realizing the zero-order fringe is described. The HOE proposed and used integrates the actions of a beam combiner and a lens, and endows the interferometer with high tolerance for repositioning errors. The proposed method is simple and offers advantages such as the elimination of in situ processing for the hologram.

Novel gray coded pattern for unwrapping phase in fringe projection based 3D profiling

A method to reliably extract object profiles even with height discontinuities (that leads to 2n pi phase jumps) is proposed. This method uses Fourier transform profilometry to extract wrapped phase, and an additional image formed by illuminating the object of interest by a novel gray coded pattern for phase unwrapping. Simulation results suggest that the proposed approach not only retains the advantages of the original method, but also contributes significantly in the enhancement of its performance. Fundamental advantage of this method stems from the fact that both extraction of wrapped phase and unwrapping the same were done by gray scale images. Hence, unlike the methods that use colors, proposed method doesn't demand a color CCD camera and is ideal for profiling objects with multiple colors.

Wavelet transform analysis of truncated fringe patterns in 3-D surface profilometry

Wavelet transform analysis of projected fringe pattern for phase recovery in 3-D shape measurement of objects is investigated. The present communication specifically outlines and evaluates the errors that creep in to the reconstructed profiles when fringe images do not satisfy periodicity. Three specific cases that give raise to non-periodicity of fringe image are simulated and leakage effects caused by each one of them are analyzed with continuous complex Morlet wavelet transform. Same images are analyzed with FFT method to make a comparison of the reconstructed profiles with both methods. Simulation results revealed a significant advantage of wavelet transform profilometry (WTP), that the distortions that arise due to leakage are confined to the locations of discontinuity and do not spread out over the entire projection as in the case of Fourier transform profilometry (FTP).