Wavelet transform analysis of truncated fringe patterns in 3-D surface profilometry


Autoria(s): Gorthi, Sai Siva; Lolla, Kameswara Rao
Data(s)

2005

Resumo

Wavelet transform analysis of projected fringe pattern for phase recovery in 3-D shape measurement of objects is investigated. The present communication specifically outlines and evaluates the errors that creep in to the reconstructed profiles when fringe images do not satisfy periodicity. Three specific cases that give raise to non-periodicity of fringe image are simulated and leakage effects caused by each one of them are analyzed with continuous complex Morlet wavelet transform. Same images are analyzed with FFT method to make a comparison of the reconstructed profiles with both methods. Simulation results revealed a significant advantage of wavelet transform profilometry (WTP), that the distortions that arise due to leakage are confined to the locations of discontinuity and do not spread out over the entire projection as in the case of Fourier transform profilometry (FTP).

Formato

application/pdf

Identificador

http://eprints.iisc.ernet.in/43737/1/Wavelet_Transform...pdf

Gorthi, Sai Siva and Lolla, Kameswara Rao (2005) Wavelet transform analysis of truncated fringe patterns in 3-D surface profilometry. In: Optical Measurement Systems for Industrial Inspection IV, Monday 13 June 2005, Bellingham, WA.

Publicador

SPIE--The International Society for Optical Engineering

Relação

http://infoscience.epfl.ch/record/130128

http://eprints.iisc.ernet.in/43737/

Palavras-Chave #Instrumentation and Applied Physics (Formally ISU)
Tipo

Conference Paper

PeerReviewed