215 resultados para bulge test fracture property


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An attempt has been made to experimentally investigate the fracture process zone (FPZ) using Acoustic Emission (AE) method in High Strength Concrete (HSC) beams subjected to monotonically increasing load. Stress waves are released during the fracture process in materials, which cause acoustic emissions. AE energy released during the fracture of notched HSC beam specimens during Three Point Bend (TPB) tests is measured and is used to investigate the FPZ in the notched HSC beams having 28-day compressive strength of 78.0 MPa. The specimens are tested by Material Testing System (MTS) of 1200 KN capacity employing Crack Mouth Opening Displacement (CMOD) control at the rate of 0.0004 mmlsec in accordance with RILEM recommendations. A brief review on AE technique applied to concrete fracture is presented. The fracture process zone developed and the AE energy released during the fracture process in high strength concrete beam specimens are presented and discussed. It was observed that AE events containing higher energy are located around the notch tip. It may be possible to relate AE energy to fracture energy of concrete.

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A modified lattice model using finite element method has been developed to study the mode-I fracture analysis of heterogeneous materials like concrete. In this model, the truss members always join at points where aggregates are located which are modeled as plane stress triangular elements. The truss members are given the properties of cement mortar matrix randomly, so as to represent the randomness of strength in concrete. It is widely accepted that the fracture of concrete structures should not be based on strength criterion alone, but should be coupled with energy criterion. Here, by incorporating the strain softening through a parameter ‘α’, the energy concept is introduced. The softening branch of load-displacement curves was successfully obtained. From the sensitivity study, it was observed that the maximum load of a beam is most sensitive to the tensile strength of mortar. It is seen that by varying the values of properties of mortar according to a normal random distribution, better results can be obtained for load-displacement diagram.

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A new series of compounds identified in the phase diagram of ZrO(2)-V(2)O(8)-MoO(3) have been synthesized via the solution combustion method. Single crystals of one of the compounds in the series, ZrV(1.50)Mo(0.50)O(7.25), were grown by the melt-cool technique from the starting materials with double the MoO(3) quantity. The room temperature average crystal structure of the grown crystals was solved using the single crystal X-ray diffraction technique. The crystals belong to the cubic crystal system, space group Pa (3) over bar (No. 205) with a = 8.8969 (4) angstrom, V = 704.24 (6) angstrom(3), and Z = 4. The final R(1) value of 0.0213 was achieved for 288 independent reflections during the structure refinement. The Zr(4+) occupies the special position (4a) whereas V(5+) and Mo(6+) occupy two unique (8c) Wyckoff positions. Two fully occupied O atoms, (24d) and (4b), one partially occupied 0 atom (8c) have been identified for this molybdovanadate, which is a unique feature for these crystals. The structure is related to both ZrV(2)O(7) and cubic ZrMo(2)O(8). The temperature dependent single crystal studies show negative thermal expansion above 370 K. The compounds have been characterized by powder X-ray diffraction, solid-state UV-vis diffuse reflectance spectra, scanning electron microscopy (SEM), and transmission electron microscopy (TEM). The photocatalytic activity of these compounds has been investigated for the degradation of various dyes, and these compounds show specificity toward the degradation of non-azoic dyes.

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Abstract—DC testing of parametric faults in non-linear analog circuits based on a new transformation, entitled, V-Transform acting on polynomial coefficient expansion of the circuit function is presented. V-Transform serves the dual purpose of monotonizing polynomial coefficients of circuit function expansion and increasing the sensitivity of these coefficients to circuit parameters. The sensitivity of V-Transform Coefficients (VTC) to circuit parameters is up to 3x-5x more than sensitivity of polynomial coefficients. As a case study, we consider a benchmark elliptic filter to validate our method. The technique is shown to uncover hitherto untestable parametric faults whose sizes are smaller than 10 % of the nominal values. I.

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Scan circuit is widely practiced DFT technology. The scan testing procedure consist of state initialization, test application, response capture and observation process. During the state initialization process the scan vectors are shifted into the scan cells and simultaneously the responses captured in last cycle are shifted out. During this shift operation the transitions that arise in the scan cells are propagated to the combinational circuit, which inturn create many more toggling activities in the combinational block and hence increases the dynamic power consumption. The dynamic power consumed during scan shift operation is much more higher than that of normal mode operation.