An New Area Function for Sharp indenter Tips in Nanoindentation

A new area function is introduced and applied to a Berkovich tip in order to characterize the contact projected area between an indenter and indented material. The function can be related directly to tip-rounding, thereby having obviously physical meaning. Nanoindentation experiments are performed on a commercial Nano Indenter XPsystem. The other two area functions introduced by Oliver and Pharr and by Thurn and Cook respectively are involved in this paper for comparison. By comparison from experimental results among different area functions, the indenter tip described by the proposed area function here is very close to the experimental indenter.

Fabrication of nanometer-sized electrodes and tips for scanning electrochemical microscopy

A novel method for fabrication of nanometer-sized electrodes and tips suitable for scanning electrochemical microscopy (SECM) is reported. A fine etched Pt wire is coated with polyimide, which was produced by polymerization on the Pt surface initiated by heat. This method can prepare electrodes with effective radii varying from a few to hundreds of nanometers. Scanning electron microscopy, cyclic voltammetry, and SECM were used to characterize these electrodes. Well-defined steady-state voltammograms could be obtained in aqueous or in 1,2-dichloroethane solutions. Ibis method produced the nanoelectrodes with exposed Pit on the apex, and they can also be employed as the nanotips for SECM investigations. Different sizes of Pt nanotips made by this method were employed to evaluate the kinetics of the redox reaction of Ru(NH3)6(3+) on the surface of a large Pt electrode by SECM, and the standard rate constant kappa (o) of this system was calculated from the best fit of the SECM approach curve. This result is similar to the values obtained by analysis of the obtained voltammetric data.

FABRICATION AND CHARACTERIZATION OF TIPS FOR ELECTROCHEMICAL SCANNING-TUNNELING-MICROSCOPY

We report a new technique for preparing tips for electrochemical scanning tunneling microscopy (ECSTM) with particular consideration of its simplicity and reproducibility. In preparing scanning tunneling microscopy (STM) tips by electrochemical etching, w

FABRICATION OF STM TIPS WITH CONTROLLED GEOMETRY BY ELECTROCHEMICAL ETCHING AND ECSTM TIPS COATED WITH PARAFFIN

We have presented two simple methods of ''unfixed-position shield'' and ''pulling out'' for making sharp STM Pt-Ir tips with low aspect ratio by electrochemical etching in KCN/NaOH aqueous solution and ECSTM tips coated with paraffin. By limiting the elec

The Stability of a Vertical Single-Walled Carbon Nanotube Under Its Own Weight

It has been reported recently that single carbon nanotubes were attached to AFM tips to act as nanotweezers. In order to investigate its stability, a vertical single-walled carbon nanotube (SWCNT) under its own weight is studied in this paper. The lower end of the carbon nanotube is clamped. Firstly the governing dimensionless numbers are derived by dimensional analysis. Then the theoretical analysis based on an elastic column model is carried out. Two ratios, I.e., the ratio of half wall thickness to radius (t=R) and the ratio of gravity to elastic resilience ($\rho$gR=E), and their influences on the ratio of critical length to radius are discussed. It is found that the relationship between the critical ratio of altitude to radius and ratio of half thickness to radius is approximately linear. As the dimensionless number $\rho$gR=E increases, the compressive force per unit length (weight) becomes larger, thus critical ratio of altitude to radius must become smaller to maintain stability. At last the critical length of SWCNT is calculated. The results of this paper will be helpful for the stability design of nanotweezers-like nanostructures.

Plane strain asymptotic fields for cracks terminating at the interface between elastic and pressure-sensitive dilatant materials

The plane strain asymptotic fields for cracks terminating at the interface between elastic and pressure-sensitive dilatant material are investigated in this paper. Applying the stress-strain relation for the pressure-sensitive dilatant material, we have obtained an exact asymptotic solution for the plane strain tip fields for two types of cracks, one of which lies in the pressure-sensitive dilatant material and the other in the elastic material and their tips touch both the bimaterial interface. In cases, numerical results show that the singularity and the angular variations of the fields obtained depend on the material hardening exponent n, the pressure sensitivity parameter mu and geometrical parameter lambda.

Singularity of dynamic stress fields around an interface crack between viscoelastic bodies

The singular nature of the dynamic stress fields around an interface crack located between two dissimilar isotropic linearly viscoelastic bodies is studied. A harmonic load is imposed on the surfaces of the interface crack. The dynamic stress fields around the crack are obtained by solving a set of simultaneous singular integral equations in terms of the normal and tangent crack dislocation densities. The singularity of the dynamic stress fields near the crack tips is embodied in the fundamental solutions of the singular integral equations. The investigation of the fundamental solutions indicates that the singularity and oscillation indices of the stress fields are both dependent upon the material constants and the frequency of the harmonic load. This observation is different from the well-known -1/2 oscillating singularity for elastic bi-materials. The explanation for the differences between viscoelastic and elastic bi-materials can be given by the additional viscosity mismatch in the case of viscoelastic bi-materials. As an example, the standard linear solid model of a viscoelastic material is used. The effects of the frequency and the material constants (short-term modulus, long-term modulus and relaxation time) on the singularity and the oscillation indices are studied numerically.

Computation of stress intensity factors by the sub-region mixed finite element method of lines

Based on the sub-region generalized variational principle, a sub-region mixed version of the newly-developed semi-analytical 'finite element method of lines' (FEMOL) is proposed in this paper for accurate and efficient computation of stress intensity factors (SIFs) of two-dimensional notches/cracks. The circular regions surrounding notch/crack tips are taken as the complementary energy region in which a number of leading terms of singular solutions for stresses are used, with the sought SIFs being among the unknown coefficients. The rest of the arbitrary domain is taken as the potential energy region in which FEMOL is applied to obtain approximate displacements. A mixed system of ordinary differential equations (ODEs) and algebraic equations is derived via the sub-region generalized variational principle. A singularity removal technique that eliminates the stress parameters from the mixed equation system eventually yields a standard FEMOL ODE system, the solution of which is no longer singular and is simply and efficiently obtained using a standard general-purpose ODE solver. A number of numerical examples, including bi-material notches/cracks in anti-plane and plane elasticity, are given to show the generally excellent performance of the proposed method.

Elastic-plastic finite element analyses of short cracks

Stress and strain distributions and crack opening displacement characteristics of short cracks have been studied in single edge notch bend and centre cracked panel specimens using elastic–plastic finite element analyses incorporating both a non strain hardening and a power law hardening behaviour. J contour integral solutions to describe stress strain conditions at crack tips for short cracks differ from those for long cracks. The analyses show that (i) short cracks can propagate at stress levels lower than those required for long cracks and (ii) a two-parameter description of crack tip fields is necessary for crack propagation.

关于科技论文写作的一点粗浅体会

科技论文写作对总结科学研究的创新发现是至关重要的。本文作者对如何撰写或写好科技论文,从论文写作的基本元素及常见问题等方面言简意赅地提出了很有意义的见解。

低密度台阶形闪耀光栅的制作

介绍了制作低密度闪耀光栅的过程,在制作时,对传统的制作过程进行了改进,有效提高了制作质量。以40μm闪耀光栅为例介绍了制作的过程,得到了良好的光栅表面形貌,并且闪耀级次的衍射效率达到了70%以上。相比传统的制作方法,效率提高了5%～10%。对比了理论上的衍射效率,分析了实验误差,发现把存在对准误差的光栅进行处理将会有效地提高其衍射效率,为进一步提高闪耀光栅的衍射效率提供了依据。

全球变化下中国东北样带植物多样性梯度分析及气候-NDVI-植被的关系研究

中国东北样带（NorthEast China Transect, NECT）是位于中纬度温带以降水量作为主要驱动因素的陆地样带。本文的工作以此作为研究平台，利用生态信息系统（Ecological Information System, EIS）以及Microsoft Excel 7.0软件包建立了样带的地理数据库和植物多样性数据库，包括气候数据库、植被数据库、遥感数据库和内蒙内C_4植物数据库以及样带内生态系统特征数据库。在此基础上，主要研究了以下四个方面的内容： 1. 利用Holdridge的生命地带方法对NECT内的生物群区进行了划分。 主要是确定了生物群区间过渡带的位置与宽度，并预测了在全球变化三种模式下NECT内生物群区，尤其是过渡带的变化图景。湿度升高2 ℃后，过渡带的面积都呈扩大化的趋势。森林区对于降水量的变化反应很敏感。荒漠灌丛（即荒漠草原类型）由于其水热条件处于样带内较极端类型，因而对于全球气候变化反应也比较敏感。 2. 研究了NECT内的α、β多样性以及包括生活型、水分生态型、区系地理成分等在内的植物群落特征多样性的梯度变化规律。 研究了样带内的多样性梯度，提出了在样带内存在的α多样性测度问题以及β多样性沿样带的变化规律：样带内由东到西，β多样性逐渐升高，群落内物种被替代的速率变慢;两种植被类型边界上的两个样地之间的相似程度由东到西呈上升趋势;同一类型群落之间的物种周转率比不同类型群落间的物种周转率相对要低。同时将各个环境因子与α、β多样性作了回归分析，找出样带内决定α、β多样性的主要环境因子指标。 样带内沿43.5°N一线附近植物群落的生活型共有17类，水分生态型8类，区系地理成分包括17类，以此为基础分析了群落特征沿样带的变化规律。并探讨了生活型分布的历史地理原因。 3. 对样带气候－NDVI间的关系以及植被－NDVI的关系进行了探讨。 利用来自气象卫星的遥感数据一归一化植被指数（NDVI），和数值化后的样带1:100万植被图进行叠加，找到NECT内每种植被类型对应的NDVI值。样带内共有植被类型147种，反映在NDVI变化上的植被类型有106类。其中，自然植被101种。 影响年均NDVI分布的因子主要有经度、辐射日照百分率及7月温度，与经度呈正相关，与辐射日照时数及7月温度呈负相关。回归方程如下： NDVI = -220.426 + 3.273Lon - 80.338Ratio - 1.962T_7 (R~2 = 0.9714, F = 521.52, p < 0.001) 4. 研究了NECT内的光合功能型。 主要包括内蒙古地区的C_4植物及其生态地理特性。揭标C_4植物的分类群特性、生活型、水分生态型与区系地理成分等生态学特性。C_4植物分布的科属极其集中。C_4光合型为维管植物某些分类群（科、属、种）的特性，为它们固有的遗传特性。推断C_4起源于草本的某些科属。C_4植物为喜热、耐旱的类群。世界种、泛热带种、泛地中海种C_4植物较集中。 样带内的C_3、C_4功能型及其与环境因子的相关性。样带内C_4和C_3光合型植物组成比例由东到西表现出两高两低的趋势。分布主要与年均温和降水量呈显著相关。 提出了一种新的C_3、C_4鉴别方法。即根据野外测定的光合数据建立了C_3、C_4的判别模型： f_1(x) = -1.5493 + 0.1427Pn + 0.1035Tr + 0.3768ΔT + 0.1000Gs f_2(x) = -15.6142 + 1.0542Pn - 0.2503Tr - 0.2957ΔT + 0.6491Gs 最后，综合7个GCMs模型（GFDL，GISS，LLNL，MPI，OSU，UKMOH，UKMOL）的输出结果，利用此结果和本文建立的回归模型，模拟了样带内生物多样性的窨分布格局，并预测了末来全球变化下归一化植被指数NDVI的空间分布格局的变化。