Photoinduced electrochemical reduction of nitrite at an electrochemically roughened silver surface

Photoelectrochemical reduction of nitrite and nitrate was studied on the surface of an electrochemically roughened silver electrode. The dependence of the photocurrent on photon energy, applied potential, and concentration of nitrite was determined. It was concluded that the photoelectrochemical reduction proceeds via a photoemission process followed by the capture of hydrated electrons by electron accepters. The excitation of plasmon resonances in nanosize metal structures produced during the roughening procedure resulted in the enhancement of the photoemission process. Ammonia was detected as one of the final products in this reaction. Mechanisms for the photoelectrochemical reduction of nitrite and nitrate are proposed.

STUDIES ON INTERFACIAL PHENOMENA OF POLYCRYSTALLINE HG1-XCDXTE THIN-FILM ELECTRODE POLYSULFIDE REDOX SOLUTION

Electrode capacitance and photocurrent spectra of electrodeposited polycrystalline Hg1-xCdxTe thin films of varying (1-x) were measured in polysulfide redox solution, hence the flatband potentional PHI(fb) and the bandgap E(g) of Hg1-xCdxTe thin films obtained. It was of interest to find out that only the location of conduction band E(c) shifts negatively with increasing (1-x) while the valence band E(v), is almost constant. The experimental open circuit photovoltage V0 is smaller than theoretical value V(max) calculated through flatband potential PHI(fb), therefore there is a possibility of promoting the experimental open circuit photovoltage.

FPGA在偏振耦合测试仪中的应用

在偏振耦合测试仪的PCI接口数据采集系统中,现场可编程门阵列(FieldProgramableGateArray)实现了对模/数器件的控制功能,同时完成了与PCI总线控制器间的数据接口功能。应用自顶向下的设计思想,完成了FPGA内部的逻辑设计,并对其逻辑功能进行了仿真验证,给出了FPGA数据采集时的测试时序图。应用FPGA实现的数据采集系统可以检测出偏振耦合检测仪中的微弱干涉光信号。