Effect of buffer layer growth conditions on the secondary hexagonal phase content in cubic GaN films on GaAs(001) substrates

In this letter, we investigated the effect of the buffer layer growth conditions on the secondary hexagonal phase content in cubic GaN films on GaAs(0 0 1) substrate. The reflection high-energy electron diffraction (RHEED) pattern of the low-temperature GaN buffer layers shows that both the deposition temperature and time are important in obtaining a smooth surface. Four-circle X-ray double-crystal diffraction (XRDCD) reciprocal space mapping was used to study the hexagonal phase inclusions in the cubic GaN (c-GaN) films grown on the buffer layers. The calculation of the volume contents of the hexagonal phase shows that higher temperature and longer time deposition of the buffer layer is not preferable for growing pure c-GaN film. Under optimized condition, 47 meV FWHM of near band gap emission of the c-GaN film was achieved. (C) 2000 Elsevier Science B.V. All rights reserved.

Hole capture barrier of self-organized InAs quantum dots

Deep level transient spectroscopy (DLTS) technique was successfully applied to characterize the electric properties of p type self-organized InAs quantum dots. The ground state energy and capture barrier energy of hole of quantum dots were measured for the first time. The energy of ground state of 2.5ML InAs quantum dots with respect to the valence band of bulk GaAs was obtained being about 0.09eV, and there was a barrier associated to the change of charge state of quantum dots. The capture barrier energy of such dots for hole was about 0.26eV. The work is very meaningful for further understanding the intrinsic properties of quantum dots.

A study of the interface of CeO2/Si heterostructure grown by ion beam deposition

Epitaxial cerium dioxide films on single-crystal silicon substrates (CeO2/Si) have been grown by a dual mass-analyzed low-energy ion beam deposition (IBD) system. By double-crystal X-ray diffraction (XRD), Full Width at Half Maximum (FWHM) are 23' and 33' in the rocking curves for (222) and (111) faces of the CeO2 film, respectively, and the lattice-mismatch Delta a/a with the substrate is about - 0.123%. The results show that the CeO2/Si grown by IBD is of high crystalline quality. In this work, the CeO2/Si heterostructure were investigated by X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) measurements. Especially, XPS and AES depth profiling was used to analyze the compositions and structures in the interface regions of the as-grown and post-annealed CeO2/Si. It was found that there was no silicon oxide in the interface region of the as-grown sample but silicon oxide in the post-annealed sample. The reason for obtaining such high quality heterostructure mainly depends on the absence of silicon oxide in the surface at the beginning of the deposition. (C) 1998 Elsevier Science Ltd. All rights reserved.

Fracture properties of PECVD silicon nitride thin films by long rectangular memrane bulge test

Bulge test combined with a refined load-deflection model for long rectangular membrane was applied to determine the mechanical and fracture properties of PECVD silicon nitride (SiNx) thin films. Plane-strain modulus E-ps prestress s(0), and fracture strength s(max) of SiNx thin films deposited both on bare Si substrate and on SiO2-topped Si substrate were extracted. The SiNx thin films on different substrates possess similar values of E-ps and s(0) but quite different values of s(max). The statistical analysis of fracture strengths were performed by Weibull distribution function and the fracture origins were further predicted.

掺Er3+玻璃上转换发光特性研究

采用高温熔制工艺制备了掺Er3+硅酸盐玻璃，应用Judd-Ofelt 理论计算了Er3+光谱参数， 发现玻璃中含有0.15 mol%Er2O3 时各参数取得最大值；分析了玻璃的吸收光谱随Er3+离子浓度的变 化关系；上转换光谱分析表明在522 nm、544 nm、658 nm 处有较强的绿光和红光，分别对应于 2H11/2→4I15/2、4 S3/2→4I15/2、4 F9/2→4I15/2 的跃迁，且522 nm 绿光强度和658nm 红光强度要远大于544 nm 绿光强度. 分析了上转换发光强度随泵浦功率和Er3+离子浓度的变化关系，揭示了上转换发光机制 主要是激发态吸收和能量转换，且均为双光子吸收过程.

基于GIS的区域土壤侵蚀模型设计

区域土壤侵蚀模型是国家和区域土壤侵蚀调查、水土保持宏观规划的支持工具。借鉴国外区域土壤侵蚀模型,以DEM栅格为空间单元,对区域土壤侵蚀的单元模型进行定量表达,包括降雨、植被截留、入渗,微地形填洼等,并利用GIS功能完成径流传递和汇集部分的计算,建立了区域土壤侵蚀模型。所建立模型在延河流域的试运算,结果接近现实,能反映土壤侵蚀时空分布趋势。模型的建立可为水土保持的宏观决策提供支持。