134 resultados para YBa2Cu3O7-x
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We present two novel 1XN dynamic optical couplers that are based on Dammann gratings to achieve dynamic optical coupled technology. One is presented by employing a specially designed Dammann grating that consists of the Dammann-grating area and the blank area. The other is developed by using two complementary even-numbered Dammann gratings. The couplers can achieve the function conversion between a beam splitter and a combiner according to the modulation of the gratings. We have experimentally demonstrated 1X8 dynamic optical couplers at the wavelength of 1550 nm. The experimental results and the analyses are reported in detail.
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We present what we believe is a novel technique based on the moire effect for fully diagnosing the beam quality of an x-ray laser. Using Fresnel diffraction theory, we investigated the intensity profile of the moire pattern when a general paraxial beam illuminates a pair of Ronchi gratings in the quasi-far field. Two formulas were derived to determine the beam quality factor M-2 and the effective radius of curvature R-e from the moire pattern. On the basis of the results, the far-field divergence, the waist location, and the radius can be calculated further. Finally, we verified the approach by use of numerical simulation. (C) 1999 Optical Society of America [S0740-3232(99)01502-1].
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X光条纹相机在惯性约束聚变实验诊断中具有重要作用.它的性能技术指标的精确标定是实验数据可信度的基础。在上海激光联合实验室的20TW激光器上对X光条纹相机的扫速、时间分辨等时间性能进行了标定,取得了较好的结果。标定结果显示相机的各项性能与出厂标称值有了较大改变。标定的实验结果可有效提高ICF实验数据处理和物理分析的可靠性。
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质子激发X射线荧光(proton induced X-ray emission,PIXE)技术是一种高灵敏度、非破坏性、多元素定量测定的分析方法。采用外束PIXE技术对内蒙古地区和博山出土的一批古代玻璃的化学成分进行了定量测定。结果表明:内蒙古地区出土的玻璃中,西周时期的玻璃珠是含有少量K2O和CaO助熔剂的釉砂,其主要成分为SiO2;汉代的玻璃珠属于PbO—SiO2玻璃;多数元代的玻璃制品和部分北魏时期的玻璃珠属于K2O—CaO—SiO2玻璃。博山出土的元末明初的玻璃基本为KzO-CaO—SiO2系玻璃
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采用改进的外束质子激发x射线荧光、电感耦合等离子体原子发射光谱分析等技术,对广西合浦地区出土的一批汉代古玻璃样品的化学成分和结构特性等进行了检测。结果表明:两汉时期,合浦地区的古代玻璃存在K2O—SiO2、PbO-BaO-SiO2、PbO—SiO2、Na2O-K2O-PbO-SiO2、(Na2O)K2O-CaO—SiO2等多种类型,但绝大多数为K2O—SiO2玻璃。表面风化可引起K2O-SiO2玻璃表面K2O等助熔剂的流失和富硅层的形成。综合化学成分以及器型特征,认为我国汉代K2O—SiO2玻璃制造技术可
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abstract {Proton induced X-ray emission (PIXE) technique is an effective method for the chemical composition analysis of ancient glass samples without destruction. Chemical composition of the ancient glass samples dated from the Warring States Period (770-476 B.C.) to the Six Dynasties Period (220-589 A.D.), which were unearthed in Sichuan area, was quantitatively determined by the PIXE technique. The results show that the glass Bi (disc) and the glass eye beads of the Warring States Period all belong to the PbO-BaO-SiO2 system. According to the composition and shape, we infer that these glass Bi and eye beads were made in China. Whereas, the chemical compositions of the glass ear pendants and beads of the Six Dynasties Period are varied, including K2O-CaO-SiO2, K2O-SiO2 and other glass systems. Based on the obtained results and those from literatures, some questions related to the technical propagation of the ancient Chinese glass are discussed.}
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利用直流磁控反应溅射技术制备了氧气和氩气的分压比为5:100的NiOx薄膜。利用X射线衍射仪(XRD)、扫描电镜(SEM)、原子力显微镜(AFM)和光谱仪研究了热处理对薄膜的微观结构和光学性质的影响, 并对沉积态薄膜的粉末进行了热分析。沉积态的NiOx薄膜在262 ℃时开始分解, 导致NiOx薄膜的透过率增加和反射率降低。X射线衍射和示差扫描量热曲线(DSC)分析表明, 在热处理过程中并无物相的变化, 光学性质的变化是由于NiOx薄膜热分解引起薄膜表面形貌发生变化而引起的。通过Kissinger公式计算出
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Phosphate glasses 60P
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Variations of peak position of the rocking curve in the Bragg case are measured from a Ge thin crystal near the K-absorption edge. The variations are caused by a phase change of the real part of the atomic scattering factor. Based on the measurement, the values of the real part are determined with an accuracy of better than 1%. The values are the most reliable ones among those reported values so far as they are directly determined from the normal atomic scattering factors.
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The basic elements of Bragg-Fresnel multilayer optics are multilayer gratings. In this paper, the fabrication process for the simplest Bragg-Fresnel multilayer optics is given; the diffraction measurements at 8-keV x rays of multilayer gratings are presented; and the measurement results in the diffraction spectrum are analyzed and discussed in detail. (C) 1996 Society of Photo-Optical Instrumentation Engineers.