Effects of silicon incorporation on composition, structure and electric conductivity of cubic boron nitride thin films

We have achieved in-situ Si incorporation into cubic boron nitride (c-BN) thin films during ion beam assisted deposition. The effects of silicon incorporation on the composition, structure and electric conductivity of c-BN thin films were investigated by Fourier transform infrared spectroscopy, X-ray photoelectron spectroscopy and electrical measurements. The results suggest that the content of the cubic phase remains stable on the whole with the incorporation of Si up to a concentration of 3.3 at.%, and the higher Si concentrations lead to a gradual change from c-BN to hexagonal boron nitride. It is found that the introduced Si atoms only replace B atoms and combine with N atoms to form Si-N bonds, and no evidence of the existence of Si-B bonds is observed. The resistance of the Si-doped c-BN films gradually decreases with increasing Si concentration, and the resistivity of the c-BN film with 3.3 at.% Si is lowered by two orders of magnitude as compared to undoped samples.

Boron isotopic fractionation during seawater evaporation

IEECAS SKLLQG

Luminescent Boron-Contained Ladder-Type pi-Conjugated Compounds

Four diboron-contained ladder-type pi-conjugated compounds 1-4 were designed and synthesized. Their thermal, photophysical, electrochemical properties, as well as density functional theory calculations, were fully investigated. The single crystals of compounds 1 and 3 were grown, and their crystal structures were determined by X-ray diffraction analysis. Both compounds have a ladder-type g-conjugated framework. Compounds I and 2 possess high thermal stabilities, moderate solid-state fluorescence quantum yields, as well as stable redox properties, indicating that they are possible candidates for emitters and charge-transporting materials in electroluminescent (EL) devices. The double-layer device with the configuration of [ITO/NPB (40 nm)/1 or 2 (70 nm)/LiF (0.5 nm)/Al (200 nm)] exhibited good EL performance with the maximum brightness exceeding 8000 cd/m(2).

White organic electroluminescence based on a new boron complex

A bright blue boron complex BPh2(pybm) containing 2-(2-pyridyl)benzimidazole ligand was designed and synthesized by using N, N-bidentate ligand instead of N, O-bidentate one such as 8-quinolinol. For three-layer LED devices with the configuration of ITO/NPB/BPh2(pybm)/Alq(3)/LiF/Al, the white light emission covering the whole visible region from 400 to 750 nm with the maximum brightness of 110 cd/m(2) and the luminous efficiency of 0.8 cd/A was observed.

Relationship between the continually expanded interlayer distance of layered silicates and excess intercalation of cationic surfactants

Excess intercalation of cationic surfactants into Na-montmorillonites (MMTs) was investigated in organically modified silicates (OMSs), synthesized with MMTs and octadecylammonium chloride (OAC) by systematically varying the surfactant loading level from 0.625 to 1, 1.25, 1.56, 2, and 2.5 with respect to the cation exchange capacity (CEC) of MMTs. Wide-angle X-ray diffraction and thermogravimetric analysis results indicated that the continuous increase of interlayer distances came from the entering of surfactants into the interlayer of MMTs. Excess surfactants were extracted with a Soxhlet apparatus, which showed two kinds of intercalation states of surfactants in the interlayer when the surfactant loading level was beyond the CEC. Fourier transform infrared spectroscopy and differential scanning calorimetry were used to explore the microstructures of OMSs. It was found that the surfactants arranged more orderly as the loading level increased and the excess surfactants piled up in the interlayer together with counterions, forming a sandwiched surfactant layer. On the basis of the results, the layer structures of OMSs and the mechanism by which the surfactants entered the interlayer were expounded: surfactant cations entered the interlayer through cation exchange reactions and were tightly attracted to the silicate platelet surfaces when the surfactant loading level was below the CEC;