280 resultados para PULSE-PROPAGATION
Resumo:
Laser-induced damages to TiO2 single layers and TiO2/SiO2 high reflectors at laser wavelength of 1064 nm, 800 run, 532 urn, and pulse width of 12 ns, 220 ps, 50 fs, 8 ns are investigated. All films are prepared by electron beam evaporation. The relations among microstructure, chemical composition, optical properties and laser-induced damage threshold (LIDT), have been researched. The dependence of damage mechanism on laser wavelength and pulse width is discussed. It is found that from 1064 nm to 532 nm, LIDT is mainly absorption related, which is determined by film's extinction coefficient and stoichiometric defects. The rapid decrease of LIDT at 800 nm is due to the pulse width factor. TiO2 coatings are mainly thermally by damaged at long pulse (tau >= 220 ps). The damage shows ablation feature at 50 fs. (C) 2007 Elsevier B.V. All rights reserved.
Resumo:
Based on the vectorial Raleigh-Sommerfeld diffraction integral, the nonparaxial. propagation of vectorial hollow Gaussian beams (HGBs) in free space is studied. The far-field and paraxial cases can be treated as special cases of our general results. The typical numerical examples are given to illustrate our analytical results and comparisons between the different approximations present that the f parameter still plays an important role in determining the nonparaxiality of vectorial diffracted HGBs. (c) 2007 Optical Society of America.
Resumo:
Based on the paraxial vectorial theory of beams propagating in uniaxially anisotropic media, we have derived the analytical propagation equations of hollow Gaussian beams (HGBs) in uniaxial crystals, and given the typical numerical example to illustrate our analytical results. Due to the anisotropy crystals, the ordinary and extraordinary beams originated by incident HGBs propagate with different diffraction lengths, thus the linear polarization state and axial symmetry of incident HGBs do not remain during propagating in crystals. (c) 2007 Published by Elsevier B.V.
Resumo:
A model of plasma formation induced by UV nanosecond pulselaser interaction with SiO2 thin film based on nanoabsorber is proposed. The model considers the temperature dependence of band gap. The numerical results show that during the process of nanosecond pulsed-laser interaction with SiO2 thin film, foreign inclusion which absorbs a fraction of incident radiation heats the surrounding host material through heat conduction causing the decrease of the band gap and consequently, the transformation of the initial transparent matrix into an absorptive medium around the inclusion, thus facilitates optical damage. Qualitative comparison with experiments is also provided. (C) 2008 Optical Society of America.