Investigation of damage threshold to TiO<inf>2</inf> coatings at different laser wavelength and pulse duration


Autoria(s): 姚建可; 范正修; Jin Yunxia; Zhao Yuanan; 贺洪波; 邵建达
Data(s)

2008

Resumo

Laser-induced damages to TiO2 single layers and TiO2/SiO2 high reflectors at laser wavelength of 1064 nm, 800 run, 532 urn, and pulse width of 12 ns, 220 ps, 50 fs, 8 ns are investigated. All films are prepared by electron beam evaporation. The relations among microstructure, chemical composition, optical properties and laser-induced damage threshold (LIDT), have been researched. The dependence of damage mechanism on laser wavelength and pulse width is discussed. It is found that from 1064 nm to 532 nm, LIDT is mainly absorption related, which is determined by film's extinction coefficient and stoichiometric defects. The rapid decrease of LIDT at 800 nm is due to the pulse width factor. TiO2 coatings are mainly thermally by damaged at long pulse (tau >= 220 ps). The damage shows ablation feature at 50 fs. (C) 2007 Elsevier B.V. All rights reserved.

Identificador

http://ir.siom.ac.cn/handle/181231/4664

http://www.irgrid.ac.cn/handle/1471x/12909

Idioma(s)

英语

Fonte

姚建可;范正修;Jin Yunxia;Zhao Yuanan;贺洪波;邵建达 .,Thin Solid Films,2008,516(6):1237-1241

Palavras-Chave #光学薄膜 #TiO2 monolayer #TiO2/SiO2 high reflectors #laser damage #laser wavelength #pulse duration #X-ray photoelectron spectroscopy
Tipo

期刊论文