2 resultados para polaron
em Cambridge University Engineering Department Publications Database
Resumo:
The oxygen vacancy has been inferred to be the critical defect in HfO 2, responsible for charge trapping, gate threshold voltage instability, and Fermi level pinning for high work function gates, but it has never been conclusively identified. Here, the electron spin resonance g tensor parameters of the oxygen vacancy are calculated, using methods that do not over-estimate the delocalization of the defect wave function, to be g xx = 1.918, g yy = 1.926, g zz = 1.944, and are consistent with an observed spectrum. The defect undergoes a symmetry lowering polaron distortion to be localized mainly on a single adjacent Hf ion. © 2012 American Institute of Physics.
Resumo:
The monovalent potassium doped manganites Pr0.6Sr 0.4-xKxMnO3 (x = 0.05-0.2) are characterized using the complementary magnetic susceptibility and electron resonance methods. In paramagnetic phase the temperature variations of the inverse magnetic susceptibility and the inverse intensity of resonance signal obey the Curie-Weiss law. A similarity in temperature variation of resonance signal width and the adiabatic polaron conductivity points to the polaron mechanism controlling the resonance linewidth. The low temperature limit of the pure paramagnetic phase is determined from the electron resonance spectra revealing the mixed phase spread down to the Curie temperature. © 2013 Elsevier B.V. All rights reserved.