On-site tests for the detection of potential induced degradation in modules

This paper presents different test alternatives which can be used on-site in a PV installation to detect potential induced degradation (PID) in modules. The testing procedures proposed are: thermal imaging; electroluminescence imaging; open circuit voltage measurements; operating voltage measurements; IV curve measurements; and dark IV curve measurements. Advantages and disadvantages of each test are reported.

A bankable method for the field testingor a CPV plant

The bankability of CPV projects is an important issue to pave the way toward a swift and sustained growth in this technology. The bankability of a PV plant is generally addressed through the modeling of its energy yield under a b aseline loss scenario, followed by an on-site measurement campaign aimed at verifying its energetic behavior. The main difference between PV and CPV resides in the proper CPV modules, in particular in the inclusion of optical lements and III-V multijunction cells that are much more sensitive to spectral variations than xSi cells, while the rest of the system behaves in a way that possesses many common points with xSi technology. The modeling of the DC power output of a CPV system thus requires several impo rtant second order parameters to be considered, mainly related to optics, spectral direct solar radiation, wind speed, tracker accuracy and heat dissipation of cells.