On-site tests for the detection of potential induced degradation in modules
| Data(s) |
2013
|
|---|---|
| Resumo |
This paper presents different test alternatives which can be used on-site in a PV installation to detect potential induced degradation (PID) in modules. The testing procedures proposed are: thermal imaging; electroluminescence imaging; open circuit voltage measurements; operating voltage measurements; IV curve measurements; and dark IV curve measurements. Advantages and disadvantages of each test are reported. |
| Formato |
application/pdf |
| Identificador | |
| Idioma(s) |
eng |
| Publicador |
E.T.S.I. Telecomunicación (UPM) |
| Relação |
http://oa.upm.es/30003/1/INVE_MEM_2013_165678.pdf info:eu-repo/semantics/altIdentifier/doi/null |
| Direitos |
http://creativecommons.org/licenses/by-nc-nd/3.0/es/ info:eu-repo/semantics/openAccess |
| Fonte |
28th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) | 28th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) | 30/09/2013 - 04/10/2013 | París, France |
| Palavras-Chave | #Telecomunicaciones |
| Tipo |
info:eu-repo/semantics/conferenceObject Ponencia en Congreso o Jornada PeerReviewed |
