4 resultados para Semiconductor device manufacture

em University of Michigan


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A Laser Scanner System (LSS) produces a photoresponse map and can be used for the nondestructive detection of nonuniformities in the photoresponse of a semiconductor device. At SERI the photoresponse maps are used to identify solar cell faults including microcracks, metallization breaks, regions of poor contact between metallization and the underlying emitter surface, and variations in emitter sheet resistance.

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Included are 464 selected references on the theory, manufacture, properties, performance, and utliization of semiconductor materials for the detection of nuclear radiation. Reports and open literature references are covered through January 1962.