Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script /

Includes bibliographical references (p. 14).

A 25-kV bias-isolation unit for 1-MHz capacitance and conductance measurements /

Includes bibliographical references.

Safe operation of capacitance meters using high applied-bias voltage /

Includes bibliographical references (p. 49).