Determination of Cr:LiSAF crystals ablation thresholds on the 20 ps regime using a diagonal scan


Autoria(s): Society of Photho-optical Instrumentation Engineers
Contribuinte(s)

HOFFMAN, HANNA J. (Ed.)

SHORI, RAMESH K. (Ed.)

HODGSON, NORMAN (Ed.)

Cobertura

I

Data(s)

25/11/2015

25/11/2015

20/01/2007

Formato

64511C-1 - 64511C-8

Identificador

http://hdl.handle.net/123456789/25273

Publicador

Society of Photho-optical Instrumentation Engineers

Direitos

openAccess

Palavras-Chave #LASERS #CRYSTALS #CHROMIUM #LITHIUM #STRONTIUM #ALUMINIUM #FLUORINE #ABLATION #THREHOLD ENERGY
Tipo

Texto completo de evento