Enhancement of oxidation rate of a-Si nanoparticles during dehydrogenation


Autoria(s): Das, Debabrata; Farjas Silva, Jordi; Roura Grabulosa, Pere; Viera Mármol, Gregorio; Bertrán Serra, Enric
Data(s)

01/11/2001

Resumo

Oxidation of amorphous silicon (a-Si) nanoparticles grown by plasma-enhanced chemical vapor deposition were investigated. Their hydrogen content has a great influence on the oxidation rate at low temperature. When the mass gain is recorded during a heating ramp in dry air, an oxidation process at low temperature is identified with an onset around 250°C. This temperature onset is similar to that of hydrogen desorption. It is shown that the oxygen uptake during this process almost equals the number of hydrogen atoms present in the nanoparticles. To explain this correlation, we propose that oxidation at low temperature is triggered by the process of hydrogen desorption

Formato

application/pdf

Identificador

Das, D., Farjas, J., Roura, P., Viera, G., i Bertran, E. (2001). Enhancement of oxidation rate of a-Si nanoparticles during dehydrogenation. Applied Physics Letters, 79 (22), 3705 - 3707. Recuperat 28 setembre 2010, a http://apl.aip.org/resource/1/applab/v79/i22/p3705_s1

0003-6951

http://hdl.handle.net/10256/3051

http://dx.doi.org/10.1063/1.1420533

Idioma(s)

eng

Publicador

American Institute of Physics

Relação

Reproducció digital del document publicat a: http://dx.doi.org/10.1063/1.1420533

© Applied Physics Letters, 2001, vol. 79, núm. 22, p. 3705-3707

Articles publicats (D-F)

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Tots els drets reservats

Palavras-Chave #Anàlisi tèrmica #Hidrogenació #Semiconductors amorfs #Silici -- Oxidació #Materials nanoestructurals #Amorphous semiconductors #Hydrogenation #Nanostructure materials #Silicon -- Oxidation #Thermal analysis
Tipo

info:eu-repo/semantics/article