Analysis of source-follower buffers implemented with graded-channel SOI nMOSFETs operating at cryogenic temperatures


Autoria(s): SOUZA, Michelly de; FLANDRE, Denis; PAVANELLO, Marcelo Antonio
Contribuinte(s)

UNIVERSIDADE DE SÃO PAULO

Data(s)

18/10/2012

18/10/2012

2009

Resumo

This work studies the operation of source-follower buffers implemented with standard and graded-channel (GC) fully depleted (FD) SCI nMOSFETs at low temperatures. The analysis is performed by comparing the voltage gain of buffers implemented with GC and standard SOI nMOS transistors considering devices with the same mask channel length and same effective channel length. It is shown that the use of GC devices allows for achieving improved gain in all inversion levels in a wide range of temperatures. In addition, this improvement increases as temperature is reduced. It is shown that GC transistors can provide virtually constant gain, while for standard devices, the gain departs from the maximum value depending on the temperature and inversion level imposed by the bias current and input voltage. Two-dimensional numerical simulations were performed in order to study the reasons for the enhanced gain of GC MOSFETs at low temperatures. (C) 2009 Elsevier Ltd. All rights reserved.

Identificador

CRYOGENICS, v.49, n.11, p.599-604, 2009

0011-2275

http://producao.usp.br/handle/BDPI/18820

10.1016/j.cryogenics.2008.12.010

http://dx.doi.org/10.1016/j.cryogenics.2008.12.010

Idioma(s)

eng

Publicador

ELSEVIER SCI LTD

Relação

Cryogenics

Direitos

restrictedAccess

Copyright ELSEVIER SCI LTD

Palavras-Chave #Semiconductors #Cryoelectronics #ON-INSULATOR NMOSFETS #ANALOG APPLICATIONS #PERFORMANCE #DESIGN #MOSFETS #CMOS #ADVANTAGES #CIRCUIT #BULK #Thermodynamics #Physics, Applied
Tipo

article

proceedings paper

publishedVersion