Electronic characteristics of InAs self-assembled quantum dots
Data(s) |
2000
|
---|---|
Resumo |
Deep-level transient spectroscopy and photoluminescence studies have been carried out on structures containing self-assembled InAs quantum dots formed in GaAs matrices. The use of n- and p-type GaAs matrices allows us to study separately electron and hole levels in the quantum dots by the deep-level transient spectroscopy technique. From analysis of deep-level transient spectroscopy measurements it follows that the quantum dots have electron levels 130 meV below the bottom of the GaAs conduction band and heavy-hole levels at 90 meV above the top of the GaAs valence band. Combining with the photoluminescence results, the band structures of InAs and GaAs have been determined. (C) 2000 Elsevier Science B.V. All rights reserved. Deep-level transient spectroscopy and photoluminescence studies have been carried out on structures containing self-assembled InAs quantum dots formed in GaAs matrices. The use of n- and p-type GaAs matrices allows us to study separately electron and hole levels in the quantum dots by the deep-level transient spectroscopy technique. From analysis of deep-level transient spectroscopy measurements it follows that the quantum dots have electron levels 130 meV below the bottom of the GaAs conduction band and heavy-hole levels at 90 meV above the top of the GaAs valence band. Combining with the photoluminescence results, the band structures of InAs and GaAs have been determined. (C) 2000 Elsevier Science B.V. All rights reserved. 于2010-11-15批量导入 zhangdi于2010-11-15 17:02:24导入数据到SEMI-IR的IR Made available in DSpace on 2010-11-15T09:02:24Z (GMT). No. of bitstreams: 1 2953.pdf: 107944 bytes, checksum: f941fc53701774eea62e58f9afe06007 (MD5) Previous issue date: 2000 Japan Soc Appl Phys. Chinese Acad Sci, Inst Semicond, Natl Lab Superlattices & Microstruct, Beijing 100083, Peoples R China Japan Soc Appl Phys. |
Identificador | |
Idioma(s) |
英语 |
Publicador |
ELSEVIER SCIENCE BV PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS |
Fonte |
Wang HL; Feng SL; Zhu HJ; Ning D; Chen F .Electronic characteristics of InAs self-assembled quantum dots .见:ELSEVIER SCIENCE BV .PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 7 (3-4),PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS ,2000,383-387 |
Palavras-Chave | #半导体物理 #InAs/GaAs quantum dots #self-assembled structure #DLTS #PL #band offset #ENERGY-LEVELS #CARRIER RELAXATION #SPECTROSCOPY |
Tipo |
会议论文 |