SiGe/Si quantum well resonant-cavity-enhanced photodetector


Autoria(s): Li C; Yang QQ; Wang HJ; Zhu JL; Luo LP; Yu JZ; Wang QM
Data(s)

2000

Resumo

Resonant-cavity-enhanced photodetectors have been demonstrated to be able to improve the bandwidth-efficiency product. We report a novel SiGe/Si multiple quantum-well resonant-cavity-enhanced photodetector fabricated on a separation-by-implanted-oxygen wafer operating near 1300nm. The buried oxide layer in SIMOX is used as a bottom mirror to form a vertical cavity with silicon dioxide/silicon Bragg reflector deposited on the top surface. The quantum efficiency at the wavelength of 1300nm is measured with 3.5% at a reverse bias of 15V, which is enhanced by 10 folds compared with a conventional photodetector with the same absorption structures.

Resonant-cavity-enhanced photodetectors have been demonstrated to be able to improve the bandwidth-efficiency product. We report a novel SiGe/Si multiple quantum-well resonant-cavity-enhanced photodetector fabricated on a separation-by-implanted-oxygen wafer operating near 1300nm. The buried oxide layer in SIMOX is used as a bottom mirror to form a vertical cavity with silicon dioxide/silicon Bragg reflector deposited on the top surface. The quantum efficiency at the wavelength of 1300nm is measured with 3.5% at a reverse bias of 15V, which is enhanced by 10 folds compared with a conventional photodetector with the same absorption structures.

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SPIE.

Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China

SPIE.

Identificador

http://ir.semi.ac.cn/handle/172111/13731

http://www.irgrid.ac.cn/handle/1471x/105047

Idioma(s)

英语

Publicador

SPIE-INT SOC OPTICAL ENGINEERING

1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA

Fonte

Li C; Yang QQ; Wang HJ; Zhu JL; Luo LP; Yu JZ; Wang QM .SiGe/Si quantum well resonant-cavity-enhanced photodetector .见:SPIE-INT SOC OPTICAL ENGINEERING .TERAHERTZ AND GIGAHERTZ ELECTRONICS AND PHOTONICS II, 4111,1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA ,2000,54-59

Palavras-Chave #光电子学 #RCE photodetector #SiGe/Si #SIMOX #Bragg reflector
Tipo

会议论文