SiGe/Si quantum well resonant-cavity-enhanced photodetector
Data(s) |
2000
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Resumo |
Resonant-cavity-enhanced photodetectors have been demonstrated to be able to improve the bandwidth-efficiency product. We report a novel SiGe/Si multiple quantum-well resonant-cavity-enhanced photodetector fabricated on a separation-by-implanted-oxygen wafer operating near 1300nm. The buried oxide layer in SIMOX is used as a bottom mirror to form a vertical cavity with silicon dioxide/silicon Bragg reflector deposited on the top surface. The quantum efficiency at the wavelength of 1300nm is measured with 3.5% at a reverse bias of 15V, which is enhanced by 10 folds compared with a conventional photodetector with the same absorption structures. Resonant-cavity-enhanced photodetectors have been demonstrated to be able to improve the bandwidth-efficiency product. We report a novel SiGe/Si multiple quantum-well resonant-cavity-enhanced photodetector fabricated on a separation-by-implanted-oxygen wafer operating near 1300nm. The buried oxide layer in SIMOX is used as a bottom mirror to form a vertical cavity with silicon dioxide/silicon Bragg reflector deposited on the top surface. The quantum efficiency at the wavelength of 1300nm is measured with 3.5% at a reverse bias of 15V, which is enhanced by 10 folds compared with a conventional photodetector with the same absorption structures. 于2010-10-29批量导入 Made available in DSpace on 2010-10-29T06:36:53Z (GMT). No. of bitstreams: 1 2894.pdf: 630348 bytes, checksum: ce83674059b65d4e6226f1d2f369b646 (MD5) Previous issue date: 2000 SPIE. Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China SPIE. |
Identificador | |
Idioma(s) |
英语 |
Publicador |
SPIE-INT SOC OPTICAL ENGINEERING 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA |
Fonte |
Li C; Yang QQ; Wang HJ; Zhu JL; Luo LP; Yu JZ; Wang QM .SiGe/Si quantum well resonant-cavity-enhanced photodetector .见:SPIE-INT SOC OPTICAL ENGINEERING .TERAHERTZ AND GIGAHERTZ ELECTRONICS AND PHOTONICS II, 4111,1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA ,2000,54-59 |
Palavras-Chave | #光电子学 #RCE photodetector #SiGe/Si #SIMOX #Bragg reflector |
Tipo |
会议论文 |