Electronic characteristics of InAs self-assembled quantum dots


Autoria(s): Wang HL; Feng SL; Zhu HJ; Ning D; Chen F
Data(s)

2000

Resumo

Deep-level transient spectroscopy and photoluminescence studies have been carried out on structures containing self-assembled InAs quantum dots formed in GaAs matrices. The use of n- and p-type GaAs matrices allows us to study separately electron and hole levels in the quantum dots by the deep-level transient spectroscopy technique. From analysis of deep-level transient spectroscopy measurements it follows that the quantum dots have electron levels 130 meV below the bottom of the GaAs conduction band and heavy-hole levels at 90 meV above the top of the GaAs valence band. Combining with the photoluminescence results, the band structures of InAs and GaAs have been determined. (C) 2000 Elsevier Science B.V. All rights reserved.

Identificador

http://ir.semi.ac.cn/handle/172111/12558

http://www.irgrid.ac.cn/handle/1471x/65249

Idioma(s)

英语

Fonte

Wang HL; Feng SL; Zhu HJ; Ning D; Chen F .Electronic characteristics of InAs self-assembled quantum dots ,PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES,2000,7(3-4):383-387

Palavras-Chave #半导体物理 #InAs/GaAs quantum dots #self-assembled structure #DLTS #PL #band offset #ENERGY-LEVELS #CARRIER RELAXATION #SPECTROSCOPY
Tipo

期刊论文